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BibTeX record conf/itc/RighterSB96
@inproceedings{DBLP:conf/itc/RighterSB96, author = {Alan W. Righter and Jerry M. Soden and Richard W. Beegle}, title = {High Resolution I\({}_{\mbox{DDQ}}\) Characterization and Testing - Practical Issues}, booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996}, pages = {259--268}, publisher = {{IEEE} Computer Society}, year = {1996}, url = {https://doi.org/10.1109/TEST.1996.556970}, doi = {10.1109/TEST.1996.556970}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/RighterSB96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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