BibTeX record conf/itc/SadiCTCWT16

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@inproceedings{DBLP:conf/itc/SadiCTCWT16,
  author       = {Mehdi Sadi and
                  Gustavo K. Contreras and
                  Dat Tran and
                  Jifeng Chen and
                  LeRoy Winemberg and
                  Mark M. Tehranipoor},
  title        = {{BIST-RM:} BIST-assisted reliability management of SoCs using on-chip
                  clock sweeping and machine learning},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805862},
  doi          = {10.1109/TEST.2016.7805862},
  timestamp    = {Tue, 30 Nov 2021 11:31:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SadiCTCWT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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