BibTeX record conf/itc/WadaNINF04

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@inproceedings{DBLP:conf/itc/WadaNINF04,
  author       = {Osamu Wada and
                  Toshimasa Namekawa and
                  Hiroshi Ito and
                  Atsushi Nakayama and
                  Shuso Fujii},
  title        = {Post-Packaging Auto Repair Techniques for Fast Row Cycle Embedded
                  {DRAM}},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {1016--1023},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1387367},
  doi          = {10.1109/TEST.2004.1387367},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WadaNINF04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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