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BibTeX record conf/nems/LvYYCZC10
@inproceedings{DBLP:conf/nems/LvYYCZC10, author = {Jianan Lv and Zhenchuan Yang and Guizhen Yan and Yong Cai and Baoshun Zhang and Kevin J. Chen}, title = {Residual stress characterization of GaN microstructures using bent-beam strain sensors}, booktitle = {5th {IEEE} International Conference on Nano/Micro Engineered and Molecular Systems, {NEMS} 2010, Xiamen, China, January 20-23, 2010}, pages = {138--140}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/NEMS.2010.5592164}, doi = {10.1109/NEMS.2010.5592164}, timestamp = {Wed, 16 Oct 2019 14:14:49 +0200}, biburl = {https://dblp.org/rec/conf/nems/LvYYCZC10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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