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BibTeX record conf/qrs/BenninTKKMU16
@inproceedings{DBLP:conf/qrs/BenninTKKMU16, author = {Kwabena Ebo Bennin and Koji Toda and Yasutaka Kamei and Jacky Keung and Akito Monden and Naoyasu Ubayashi}, title = {Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction Models}, booktitle = {2016 {IEEE} International Conference on Software Quality, Reliability and Security, {QRS} 2016, Vienna, Austria, August 1-3, 2016}, pages = {214--221}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/QRS.2016.33}, doi = {10.1109/QRS.2016.33}, timestamp = {Sun, 25 Oct 2020 22:54:52 +0100}, biburl = {https://dblp.org/rec/conf/qrs/BenninTKKMU16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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