BibTeX record conf/qrs/BenninTKKMU16

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@inproceedings{DBLP:conf/qrs/BenninTKKMU16,
  author       = {Kwabena Ebo Bennin and
                  Koji Toda and
                  Yasutaka Kamei and
                  Jacky Keung and
                  Akito Monden and
                  Naoyasu Ubayashi},
  title        = {Empirical Evaluation of Cross-Release Effort-Aware Defect Prediction
                  Models},
  booktitle    = {2016 {IEEE} International Conference on Software Quality, Reliability
                  and Security, {QRS} 2016, Vienna, Austria, August 1-3, 2016},
  pages        = {214--221},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/QRS.2016.33},
  doi          = {10.1109/QRS.2016.33},
  timestamp    = {Sun, 25 Oct 2020 22:54:52 +0100},
  biburl       = {https://dblp.org/rec/conf/qrs/BenninTKKMU16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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