BibTeX record conf/vts/AgrawalABFKWZ97

download as .bib file

@inproceedings{DBLP:conf/vts/AgrawalABFKWZ97,
  author       = {Vishwani D. Agrawal and
                  Robert C. Aitken and
                  J. Braden and
                  Joan Figueras and
                  S. Kumar and
                  Hans{-}Joachim Wunderlich and
                  Yervant Zorian},
  title        = {Power Dissipation During Testing: Should We Worry About it?},
  booktitle    = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
                  Monterey, California, {USA}},
  pages        = {456--457},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.ieeecomputersociety.org/10.1109/VTS.1997.10012},
  doi          = {10.1109/VTS.1997.10012},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AgrawalABFKWZ97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics