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BibTeX record conf/vts/AgrawalABFKWZ97
@inproceedings{DBLP:conf/vts/AgrawalABFKWZ97, author = {Vishwani D. Agrawal and Robert C. Aitken and J. Braden and Joan Figueras and S. Kumar and Hans{-}Joachim Wunderlich and Yervant Zorian}, title = {Power Dissipation During Testing: Should We Worry About it?}, booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, {USA}}, pages = {456--457}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1997.10012}, doi = {10.1109/VTS.1997.10012}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/AgrawalABFKWZ97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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