BibTeX record conf/vts/BhattacharyaC05

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@inproceedings{DBLP:conf/vts/BhattacharyaC05,
  author       = {Soumendu Bhattacharya and
                  Abhijit Chatterjee},
  title        = {Production Test Methods for Measuring 'Out-of-Band' Interference of
                  Ultra Wide Band {(UWB)} Devices},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {137--142},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.67},
  doi          = {10.1109/VTS.2005.67},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/BhattacharyaC05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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