BibTeX record conf/vts/BottomsCKSS01

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@inproceedings{DBLP:conf/vts/BottomsCKSS01,
  author       = {Bill Bottoms and
                  Jim Chung and
                  Bernd Koenemann and
                  Glenn Shirley and
                  Lisa Spainhower},
  title        = {Guaranteeing Quality throughout the Product Life Cycle: On-Line Test
                  and Repair to the Rescue},
  booktitle    = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
                  in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
                  {USA}},
  pages        = {153--154},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10020},
  doi          = {10.1109/VTS.2001.10020},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/BottomsCKSS01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}