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BibTeX record conf/vts/VriesJ98
@inproceedings{DBLP:conf/vts/VriesJ98, author = {R. de Vries and Augustus J. E. M. Janssen}, title = {Decreasing the Sensitivity of {ADC} Test Parameters by Means of Wobbling}, booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998, Princeton, NJ, {USA}}, pages = {386--393}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.org/10.1109/VTEST.1998.670894}, doi = {10.1109/VTEST.1998.670894}, timestamp = {Fri, 24 Mar 2023 00:04:05 +0100}, biburl = {https://dblp.org/rec/conf/vts/VriesJ98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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