BibTeX record conf/vts/WohlWKRGWJ07

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@inproceedings{DBLP:conf/vts/WohlWKRGWJ07,
  author       = {Peter Wohl and
                  John A. Waicukauski and
                  Rohit Kapur and
                  Sanjay Ramnath and
                  Emil Gizdarski and
                  Thomas W. Williams and
                  P. Jaini},
  title        = {Minimizing the Impact of Scan Compression},
  booktitle    = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
                  California, {USA}},
  pages        = {67--74},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/VTS.2007.38},
  doi          = {10.1109/VTS.2007.38},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/WohlWKRGWJ07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}