BibTeX record journals/dt/HuangKXCM15

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@article{DBLP:journals/dt/HuangKXCM15,
  author       = {Ke Huang and
                  Nathan Kupp and
                  Constantinos Xanthopoulos and
                  John M. Carulli Jr. and
                  Yiorgos Makris},
  title        = {Low-Cost Analog/RF {IC} Testing Through Combined Intra- and Inter-Die
                  Correlation Models},
  journal      = {{IEEE} Des. Test},
  volume       = {32},
  number       = {1},
  pages        = {53--60},
  year         = {2015},
  url          = {https://doi.org/10.1109/MDAT.2014.2361721},
  doi          = {10.1109/MDAT.2014.2361721},
  timestamp    = {Wed, 27 Apr 2022 08:14:24 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/HuangKXCM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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