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BibTeX record journals/dt/KeshavarziTNDDRSH02
@article{DBLP:journals/dt/KeshavarziTNDDRSH02, author = {Ali Keshavarzi and James W. Tschanz and Siva G. Narendra and Vivek De and W. Robert Daasch and Kaushik Roy and Manoj Sachdev and Charles F. Hawkins}, title = {Leakage and Process Variation Effects in Current Testing on Future {CMOS} Circuits}, journal = {{IEEE} Des. Test Comput.}, volume = {19}, number = {5}, pages = {36--43}, year = {2002}, url = {https://doi.org/10.1109/MDT.2002.1033790}, doi = {10.1109/MDT.2002.1033790}, timestamp = {Mon, 28 Feb 2022 17:00:22 +0100}, biburl = {https://dblp.org/rec/journals/dt/KeshavarziTNDDRSH02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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