BibTeX record journals/et/BasuSCB02

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@article{DBLP:journals/et/BasuSCB02,
  author       = {Subhayu Basu and
                  Indranil Sengupta and
                  Dipanwita Roy Chowdhury and
                  Sudipta Bhawmik},
  title        = {An Integrated Approach to Testing Embedded Cores and Interconnects
                  Using Test Access Mechanism {(TAM)} Switch},
  journal      = {J. Electron. Test.},
  volume       = {18},
  number       = {4-5},
  pages        = {475--485},
  year         = {2002},
  url          = {https://doi.org/10.1023/A:1016549725661},
  doi          = {10.1023/A:1016549725661},
  timestamp    = {Fri, 11 Sep 2020 15:02:42 +0200},
  biburl       = {https://dblp.org/rec/journals/et/BasuSCB02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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