BibTeX record journals/et/VrankenWFL02

download as .bib file

@article{DBLP:journals/et/VrankenWFL02,
  author       = {Harald P. E. Vranken and
                  Tom Waayers and
                  H{\'{e}}rv{\'{e}} Fleury and
                  David Lelouvier},
  title        = {Enhanced Reduced Pin-Count Test for Full-Scan Design},
  journal      = {J. Electron. Test.},
  volume       = {18},
  number       = {2},
  pages        = {129--143},
  year         = {2002},
  url          = {https://doi.org/10.1023/A:1014989408897},
  doi          = {10.1023/A:1014989408897},
  timestamp    = {Fri, 11 Sep 2020 15:02:46 +0200},
  biburl       = {https://dblp.org/rec/journals/et/VrankenWFL02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics