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BibTeX record journals/et/VrankenWFL02
@article{DBLP:journals/et/VrankenWFL02, author = {Harald P. E. Vranken and Tom Waayers and H{\'{e}}rv{\'{e}} Fleury and David Lelouvier}, title = {Enhanced Reduced Pin-Count Test for Full-Scan Design}, journal = {J. Electron. Test.}, volume = {18}, number = {2}, pages = {129--143}, year = {2002}, url = {https://doi.org/10.1023/A:1014989408897}, doi = {10.1023/A:1014989408897}, timestamp = {Fri, 11 Sep 2020 15:02:46 +0200}, biburl = {https://dblp.org/rec/journals/et/VrankenWFL02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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