BibTeX record journals/ieiceee/LeePK17

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@article{DBLP:journals/ieiceee/LeePK17,
  author       = {Hyeonggeon Lee and
                  Jong Kang Park and
                  Jong Tae Kim},
  title        = {A unified system level error model of crosstalk and electromigration
                  for on-chip interconnect},
  journal      = {{IEICE} Electron. Express},
  volume       = {14},
  number       = {5},
  pages        = {20161194},
  year         = {2017},
  url          = {https://doi.org/10.1587/elex.14.20161194},
  doi          = {10.1587/ELEX.14.20161194},
  timestamp    = {Fri, 12 Feb 2021 22:20:37 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/LeePK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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