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BibTeX record journals/ieiceee/SonKK17a
@article{DBLP:journals/ieiceee/SonKK17a, author = {Younghwan Son and Yoon Kim and Myounggon Kang}, title = {Characterization of oxide trap density with the charge pumping technique in dual-layer gate oxide}, journal = {{IEICE} Electron. Express}, volume = {14}, number = {8}, pages = {20170141}, year = {2017}, url = {https://doi.org/10.1587/elex.14.20170141}, doi = {10.1587/ELEX.14.20170141}, timestamp = {Fri, 12 Feb 2021 22:21:44 +0100}, biburl = {https://dblp.org/rec/journals/ieiceee/SonKK17a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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