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BibTeX record journals/ieicet/YamagaMST18
@article{DBLP:journals/ieicet/YamagaMST18, author = {Yusuke Yamaga and Chihiro Matsui and Yukiya Sakaki and Ken Takeuchi}, title = {Reliability Analysis of Scaled {NAND} Flash Memory Based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test}, journal = {{IEICE} Trans. Electron.}, volume = {101-C}, number = {4}, pages = {243--252}, year = {2018}, url = {https://doi.org/10.1587/transele.E101.C.243}, doi = {10.1587/TRANSELE.E101.C.243}, timestamp = {Sat, 11 Apr 2020 14:48:05 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/YamagaMST18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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