BibTeX record journals/mr/CericS02

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@article{DBLP:journals/mr/CericS02,
  author       = {Hajdin Ceric and
                  Siegfried Selberherr},
  title        = {Simulative prediction of the resistance change due to electromigration
                  induced void evolution},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1457--1460},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00169-5},
  doi          = {10.1016/S0026-2714(02)00169-5},
  timestamp    = {Sat, 09 Apr 2022 12:31:59 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CericS02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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