BibTeX record journals/mr/ChanTLT16

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@article{DBLP:journals/mr/ChanTLT16,
  author       = {Marvin Chan and
                  Cher Ming Tan and
                  Kheng Chooi Lee and
                  Chuan Seng Tan},
  title        = {Non-destructive degradation study of copper wire bond for its temperature
                  cycling reliability evaluation},
  journal      = {Microelectron. Reliab.},
  volume       = {61},
  pages        = {56--63},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.12.026},
  doi          = {10.1016/J.MICROREL.2015.12.026},
  timestamp    = {Thu, 14 Oct 2021 09:38:41 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChanTLT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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