BibTeX record journals/mr/GehringJKPGS03

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@article{DBLP:journals/mr/GehringJKPGS03,
  author       = {Andreas Gehring and
                  Francisco Jimenez{-}Molinos and
                  Hans Kosina and
                  A. Palma and
                  F. G{\'{a}}miz and
                  Siegfried Selberherr},
  title        = {Modeling of retention time degradation due to inelastic trap-assisted
                  tunneling in {EEPROM} devices},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1495--1500},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00265-8},
  doi          = {10.1016/S0026-2714(03)00265-8},
  timestamp    = {Sat, 22 Feb 2020 19:26:56 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GehringJKPGS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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