BibTeX record journals/mr/KhanLBBL17

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@article{DBLP:journals/mr/KhanLBBL17,
  author       = {Saqib A. Khan and
                  Chul Seung Lim and
                  GeunYong Bak and
                  Sanghyeon Baeg and
                  Soonyoung Lee},
  title        = {An alternative approach to measure alpha-particle-induced {SEU} cross-section
                  for flip-chip packaged {SRAM} devices: High energy alpha backside
                  irradiation},
  journal      = {Microelectron. Reliab.},
  volume       = {69},
  pages        = {100--108},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.12.004},
  doi          = {10.1016/J.MICROREL.2016.12.004},
  timestamp    = {Sat, 22 Feb 2020 19:27:18 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KhanLBBL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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