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BibTeX record journals/mr/LeeBHW17
@article{DBLP:journals/mr/LeeBHW17, author = {Hosung Lee and Sanghyeon Baeg and Nelson Hua and Shi{-}Jie Wen}, title = {Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a {BGA} package device}, journal = {Microelectron. Reliab.}, volume = {69}, pages = {88--99}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2016.12.010}, doi = {10.1016/J.MICROREL.2016.12.010}, timestamp = {Sat, 22 Feb 2020 19:28:31 +0100}, biburl = {https://dblp.org/rec/journals/mr/LeeBHW17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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