BibTeX record journals/mr/NaLKPOCS13

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@article{DBLP:journals/mr/NaLKPOCS13,
  author    = {Seong{-}Hun Na and
               Seung{-}Kyu Lim and
               Jin{-}Soo Kim and
               Hwa{-}Sun Park and
               Heung{-}Jae Oh and
               Jin{-}Won Choi and
               Su{-}Jeong Suh},
  title     = {Experimental study of bump void formation according to process conditions},
  journal   = {Microelectronics Reliability},
  volume    = {53},
  number    = {4},
  pages     = {638--644},
  year      = {2013},
  url       = {https://doi.org/10.1016/j.microrel.2012.12.006},
  doi       = {10.1016/j.microrel.2012.12.006},
  timestamp = {Tue, 21 Aug 2018 13:36:44 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/NaLKPOCS13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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