BibTeX record journals/mr/ZhengHLZ18

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@article{DBLP:journals/mr/ZhengHLZ18,
  author       = {Tao Zheng and
                  Meng Huang and
                  Yi Liu and
                  Xiaoming Zha},
  title        = {Reliability model of bond wire fatigue for {IGBT} in {MMC} with system
                  redundancy consideration},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {1164--1167},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.099},
  doi          = {10.1016/J.MICROREL.2018.07.099},
  timestamp    = {Mon, 15 Feb 2021 08:47:17 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhengHLZ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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