BibTeX record journals/tase/HaddadYKYPB18

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@article{DBLP:journals/tase/HaddadYKYPB18,
  author       = {Bashar Haddad and
                  Sen Yang and
                  Lina J. Karam and
                  Jieping Ye and
                  Nital S. Patel and
                  Martin W. Braun},
  title        = {Multifeature, Sparse-Based Approach for Defects Detection and Classification
                  in Semiconductor Units},
  journal      = {{IEEE} Trans Autom. Sci. Eng.},
  volume       = {15},
  number       = {1},
  pages        = {145--159},
  year         = {2018},
  url          = {https://doi.org/10.1109/TASE.2016.2594288},
  doi          = {10.1109/TASE.2016.2594288},
  timestamp    = {Wed, 07 Dec 2022 23:04:58 +0100},
  biburl       = {https://dblp.org/rec/journals/tase/HaddadYKYPB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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