BibTeX record journals/tc/PomeranzR02b

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@article{DBLP:journals/tc/PomeranzR02b,
  author       = {Irith Pomeranz and
                  Sudhakar M. Reddy},
  title        = {A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits
                  Based on Partitioning and Reduction of a Precomputed Test Set},
  journal      = {{IEEE} Trans. Computers},
  volume       = {51},
  number       = {11},
  pages        = {1282--1293},
  year         = {2002},
  url          = {https://doi.org/10.1109/TC.2002.1047753},
  doi          = {10.1109/TC.2002.1047753},
  timestamp    = {Sat, 20 May 2017 00:24:37 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/PomeranzR02b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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