BibTeX record journals/tcad/BaharSNG05

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@article{DBLP:journals/tcad/BaharSNG05,
  author       = {R. Iris Bahar and
                  Hui{-}Yuan Song and
                  Kundan Nepal and
                  Joel Grodstein},
  title        = {Symbolic failure analysis of complex {CMOS} circuits due to excessive
                  leakage current and charge sharing},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {24},
  number       = {4},
  pages        = {502--515},
  year         = {2005},
  url          = {https://doi.org/10.1109/TCAD.2005.844105},
  doi          = {10.1109/TCAD.2005.844105},
  timestamp    = {Thu, 24 Sep 2020 11:28:49 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/BaharSNG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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