BibTeX record journals/tcad/YuB10

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@article{DBLP:journals/tcad/YuB10,
  author       = {Xiaochun Yu and
                  Ronald D. Blanton},
  title        = {Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary
                  Characteristics},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {29},
  number       = {6},
  pages        = {977--987},
  year         = {2010},
  url          = {https://doi.org/10.1109/TCAD.2010.2048352},
  doi          = {10.1109/TCAD.2010.2048352},
  timestamp    = {Thu, 24 Sep 2020 11:29:02 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/YuB10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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