BibTeX record journals/tvlsi/0006C18

download as .bib file

@article{DBLP:journals/tvlsi/0006C18,
  author       = {Dong Wang and
                  Pak Kwong Chan},
  title        = {An Electrical Model for Nanometer {CMOS} Device Stress Effect in Design
                  and Simulation of Analog Reference Circuits},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {26},
  number       = {5},
  pages        = {958--968},
  year         = {2018},
  url          = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2794763},
  doi          = {10.1109/TVLSI.2018.2794763},
  timestamp    = {Wed, 11 Mar 2020 18:17:17 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/0006C18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.