Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "toc:db/conf/itc/itc1993.bht:"
download as .bib file
@inproceedings{DBLP:conf/itc/Abramovici93,
author = {Miron Abramovici},
title = {DOs and DON'Ts in Computing Fault Coverage},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {594},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470648},
doi = {10.1109/TEST.1993.470648},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Abramovici93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbramoviciPMS93,
author = {Miron Abramovici and
Prashant S. Parikh and
Ben Mathew and
Daniel G. Saab},
title = {On Selecting Flip-Flops for Partial Reset},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {1008--1012},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470598},
doi = {10.1109/TEST.1993.470598},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbramoviciPMS93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AguadoTML93,
author = {Maria Jos{\'{e}} Aguado and
Eduardo de la Torre and
Miguel Miranda and
Carlos A. L{\'{o}}pez{-}Barrio},
title = {Distributed Implementation of an {ATPG} System Using Dynamic Fault
Allocation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {409--418},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470671},
doi = {10.1109/TEST.1993.470671},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AguadoTML93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken93,
author = {Robert C. Aitken},
title = {{BP-1992} {A} Comparison of Defect Models for Fault Location with
I\({}_{\mbox{DDQ}}\) Measurements},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {1051--1060},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470593},
doi = {10.1109/TEST.1993.470593},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AngelottiBKD93,
author = {Frank W. Angelotti and
Wayne A. Britson and
Kerry T. Kaliszewski and
Steve M. Douskey},
title = {System Level Interconnect Test in a Tristate Environment},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {45--53},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470719},
doi = {10.1109/TEST.1993.470719},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AngelottiBKD93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Austin93,
author = {Tom Austin},
title = {Creating {A} Mixed-Signal Simulation Capability for Concurrent {IC}
Design and Test Program Development},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {125--132},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470710},
doi = {10.1109/TEST.1993.470710},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Austin93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AvraM93,
author = {LaNae J. Avra and
Edward J. McCluskey},
title = {Synthesizing for Scan Dependence in Built-In Self-Testable Desings},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {734--743},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470629},
doi = {10.1109/TEST.1993.470629},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AvraM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BarnfieldM93,
author = {S. J. Barnfield and
Will R. Moore},
title = {Multiple Fault Diagnosis in Printed Circuit Boards},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {662--671},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470637},
doi = {10.1109/TEST.1993.470637},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BarnfieldM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BeasleyRRD93,
author = {J. S. Beasley and
H. Ramamurthy and
Jaime Ram{\'{\i}}rez{-}Angulo and
Mark DeYong},
title = {i\({}_{\mbox{DD}}\) Pulse Response Testing of Analog and Digital {CMOS}
Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {626--634},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470641},
doi = {10.1109/TEST.1993.470641},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BeasleyRRD93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Beck93,
author = {Brian Beck},
title = {Practical Application of Statistical Process Control in Semiconductor
Manufacturing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {99--107},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470713},
doi = {10.1109/TEST.1993.470713},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Beck93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BeniaminyBBE93,
author = {Israel Beniaminy and
Moshe Ben{-}Bassat and
M. Bodenheimer and
M. Eshel},
title = {Experience in Diagnosing a Remote, Tele-Controlled Unit Using the
{AITEST} Expert System},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {37--44},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470720},
doi = {10.1109/TEST.1993.470720},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BeniaminyBBE93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bershteyn93,
author = {Michael Bershteyn},
title = {Calculatoin of Multiple Sets of Weights for Weighted-Random Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {1031--1040},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470595},
doi = {10.1109/TEST.1993.470595},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bershteyn93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BertrandBR93,
author = {Yves Bertrand and
Fr{\'{e}}d{\'{e}}ric Bancel and
Michel Renovell},
title = {Multiconfiguration Technique to Reduce Test Duration for Sequential
Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {989--997},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470600},
doi = {10.1109/TEST.1993.470600},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BertrandBR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BonnenbergCFKZF93,
author = {Heinz Bonnenberg and
Andreas Curiger and
Norbert Felber and
Hubert Kaeslin and
Reto Zimmermann and
Wolfgang Fichtner},
title = {{VINCI:} Secure Test of a {VLSI} High-Speed Encryption System},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {782--790},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470624},
doi = {10.1109/TEST.1993.470624},
timestamp = {Wed, 03 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BonnenbergCFKZF93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BoseAA93,
author = {Soumitra Bose and
Prathima Agrawal and
Vishwani D. Agrawal},
title = {Generation of Compact Delay Tests by Multiple-Path Activation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {714--723},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470631},
doi = {10.1109/TEST.1993.470631},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BoseAA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BouwmeesterOBSTB93,
author = {Hans Bouwmeester and
Steven Oostdijk and
Frank Bouwman and
Rudi Stans and
Loek Thijssen and
Frans P. M. Beenker},
title = {Minimizing Test Time by Exploiting Parallelism in Macro Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {451--460},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470666},
doi = {10.1109/TEST.1993.470666},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BouwmeesterOBSTB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BoyleDHI93,
author = {Rick Boyle and
Jack Donovan and
Eugene R. Hnatek and
Alex M. Ijaz},
title = {Application of Statistical Techniques to Critical System Parameters},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {108--114},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470712},
doi = {10.1109/TEST.1993.470712},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BoyleDHI93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BroseghiniL93,
author = {James Broseghini and
Donald H. Lenhert},
title = {An ALU-Based Programmable MISR/Pseudorandom Generator for a {MC68HC11}
Family Self-Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {349--358},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470678},
doi = {10.1109/TEST.1993.470678},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BroseghiniL93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Carlsson93,
author = {Gunnar Carlsson},
title = {Test Synthesis from a User Perspective},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {593},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Tue, 16 Apr 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Carlsson93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Carver93,
author = {Richard H. Carver},
title = {Mutation-Based Testing of Concurrent Programs},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {845--853},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470617},
doi = {10.1109/TEST.1993.470617},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Carver93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaarHBC93,
author = {Jarir K. Chaar and
Michael J. Halliday and
Inderpal S. Bhandari and
Ram Chillarege},
title = {On the Evaluation of Software Inspections and Tests},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {180--189},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470703},
doi = {10.1109/TEST.1993.470703},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChaarHBC93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Champlin93,
author = {Cary Champlin},
title = {IRIDIUM\({}^{\mbox{tm}}\) Satellite: {A} Large System Application
of Design for Testability},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {392--398},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470673},
doi = {10.1109/TEST.1993.470673},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Champlin93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChansonLV93,
author = {Samuel T. Chanson and
Antonio Alfredo Ferreira Loureiro and
Son T. Vuong},
title = {On the Design for Testability of Communication Software},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {190--199},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470702},
doi = {10.1109/TEST.1993.470702},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChansonLV93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CharoenrookS93,
author = {Anchada Charoenrook and
Mani Soma},
title = {Fault Diagnosis of Flash {ADC} using {DNL} Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {680--689},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470635},
doi = {10.1109/TEST.1993.470635},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CharoenrookS93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengC93,
author = {Kwang{-}Ting Cheng and
Hsi{-}Chuan Chen},
title = {Delay Testing for Non-Robust Untestable Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {954--961},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470604},
doi = {10.1109/TEST.1993.470604},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChengC93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Costello93,
author = {Joseph B. Costello},
title = {Design and Test: What Will It Take to Tie the Knot?},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {18},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Wed, 08 Feb 2012 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Costello93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Creek93,
author = {Will Creek},
title = {Characterization of Edge Placement Accuracy in High-Speed Digital
Pin Electronics},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {556--565},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470654},
doi = {10.1109/TEST.1993.470654},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Creek93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Daniel93,
author = {Wayne T. Daniel},
title = {{IEEE} 1149.1 Growing Pains},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {264},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Tue, 16 Apr 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Daniel93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DiJ93,
author = {Chennian Di and
Jochen A. G. Jess},
title = {On Accurate Modeling and Efficient Simulation of {CMOS} Opens},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {875--882},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470613},
doi = {10.1109/TEST.1993.470613},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DiJ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DiamondJ93,
author = {Scott Diamond and
Bo Janko},
title = {Extraction of Coupled {SPICE} Models for Packages and Interconnects},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {436--445},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470668},
doi = {10.1109/TEST.1993.470668},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DiamondJ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DintemanB93,
author = {Bryan J. Dinteman and
Paul Botsford},
title = {Differential Virtual Instrumentation with Continuously},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {893--901},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470611},
doi = {10.1109/TEST.1993.470611},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DintemanB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DislisDA93,
author = {Chryssa Dislis and
J. H. Dick and
Anthony P. Ambler},
title = {Algorithms for Cost Optimised Test Strategy Selection},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {383--391},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470674},
doi = {10.1109/TEST.1993.470674},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DislisDA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DislisDDAA93,
author = {Chryssa Dislis and
J. H. Dick and
I. D. Dear and
I. N. Azu and
Anthony P. Ambler},
title = {Economics Modelling for the Determination of Test Strategies for Complex
{VLSI} Boards},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {210--217},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470700},
doi = {10.1109/TEST.1993.470700},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DislisDDAA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DumasGLP93,
author = {D. Dumas and
Patrick Girard and
Christian Landrault and
Serge Pravossoudovitch},
title = {An Implicit Delay-Fault Simulation Method with Approximate Detection
Threshold Calculation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {705--713},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470632},
doi = {10.1109/TEST.1993.470632},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DumasGLP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Elentukh93,
author = {Alex Elentukh},
title = {Cultural Evolution in Software Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {270},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470689},
doi = {10.1109/TEST.1993.470689},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Elentukh93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FavalliDOR93,
author = {Michele Favalli and
Marcello Dalpasso and
Piero Olivo and
Bruno Ricc{\`{o}}},
title = {Analyss of Dynamic Effects of Resistive Bridging Faults in {CMOS}
and BiCMOS Digital ICs},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {865--874},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470614},
doi = {10.1109/TEST.1993.470614},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FavalliDOR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Feldman93,
author = {Richard K. Feldman},
title = {A Novel Instrument for Accurate Time Measurement in Automatic Calibration
of Test Systems},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {544--551},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470656},
doi = {10.1109/TEST.1993.470656},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Feldman93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FerreiraGRA93,
author = {Jos{\'{e}} Manuel Martins Ferreira and
Manuel G. Gericota and
Jos{\'{e}} L. Ramalho and
Gustavo R. Alves},
title = {{BIST} for 1149.1-Compatible Boards: {A} Low-Cost and Maximum-Flexibility
Solution},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {536--543},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470657},
doi = {10.1109/TEST.1993.470657},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FerreiraGRA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FlahertyAM93,
author = {Ed Flaherty and
Andrew Allen and
John Morris},
title = {Design for Testability of a Modular, Mixed Signal Family of {VLSI}
Devices},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {797--804},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470622},
doi = {10.1109/TEST.1993.470622},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FlahertyAM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FrischA93,
author = {Arnold Frisch and
Thomas Almy},
title = {Timing Analyzer for Embedded Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {552--555},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470655},
doi = {10.1109/TEST.1993.470655},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FrischA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gage93,
author = {Robert Gage},
title = {Structured {CBIST} in ASICs},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {332--338},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470680},
doi = {10.1109/TEST.1993.470680},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gage93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Garcia93,
author = {Rudy Garcia},
title = {Keep Alive - {A} New Requirement for High Performance uProcessor Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {446--450},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470667},
doi = {10.1109/TEST.1993.470667},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Garcia93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gayle93,
author = {Rick Gayle},
title = {The Cost of Quality: Reducing {ASIC} Defects with I\({}_{\mbox{DDQ}}\)
At-Speed Testing and Increased Fault Coverage},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {285--292},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470685},
doi = {10.1109/TEST.1993.470685},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gayle93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GondaliaGJ93,
author = {Paresh Gondalia and
Allan Gutjahr and
Wen{-}Ben Jone},
title = {Realizing a High Measure of Confidence for Defect Level Analysis of
Random Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {478--487},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470663},
doi = {10.1109/TEST.1993.470663},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GondaliaGJ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Greene93,
author = {David A. Greene},
title = {Benefits of Boundary-Scan to In-Circuit Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {263},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470694},
doi = {10.1109/TEST.1993.470694},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Greene93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HamidaK93,
author = {Naim Ben{-}Hamida and
Bozena Kaminska},
title = {Analog Circuit Testing Based on Sensitivity Computation and New Circuit
Modeling},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {652--661},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470638},
doi = {10.1109/TEST.1993.470638},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HamidaK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HaoM93,
author = {Hong Hao and
Edward J. McCluskey},
title = {Very-Low-Voltage Testing for Weak {CMOS} Logic ICs},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {275--284},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470686},
doi = {10.1109/TEST.1993.470686},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HaoM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Herlein93,
author = {Richard F. Herlein},
title = {Terminating Transmission lines in the Test Environment},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {936--944},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470606},
doi = {10.1109/TEST.1993.470606},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Herlein93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsueL93,
author = {Ching{-}Wen Hsue and
Chih{-}Jen Lin},
title = {Built-In Current Sensor for I\({}_{\mbox{DDQ}}\) Test in {CMOS}},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {635--641},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470640},
doi = {10.1109/TEST.1993.470640},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsueL93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IsernF93,
author = {Eugeni Isern and
Joan Figueras},
title = {Test Generation with High Coverages for Quiescent Current Test of
Bridging Faults in Combinational Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {73--82},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470716},
doi = {10.1109/TEST.1993.470716},
timestamp = {Wed, 20 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IsernF93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JosephsonDA93,
author = {Don Douglas Josephson and
Daniel J. Dixon and
Barry J. Arnold},
title = {Test Features of the {HP} {PA7100LC} Processor},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {764--772},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470626},
doi = {10.1109/TEST.1993.470626},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JosephsonDA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KanjilalCA93,
author = {Suman Kanjilal and
Srimat T. Chakradhar and
Vishwani D. Agrawal},
title = {A Synthesis Approach to Design for Testability},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {754--763},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470627},
doi = {10.1109/TEST.1993.470627},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KanjilalCA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Keezer93,
author = {David C. Keezer},
title = {Known Godd Die for MCMs: Enabling Technologies},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {266},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470693},
doi = {10.1109/TEST.1993.470693},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Keezer93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimK93,
author = {Kee Sup Kim and
Charles R. Kime},
title = {Partial Scan Using Reverse Direction Empirical Testability},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {498--506},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470661},
doi = {10.1109/TEST.1993.470661},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimuraKNS93,
author = {Shinichi Kimura and
Makoto Kimura and
Takayuki Nakatani and
Masao Sugai},
title = {A New Approach for {PLL} Characterization on Mixed Signal {ATE}},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {697--704},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470633},
doi = {10.1109/TEST.1993.470633},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimuraKNS93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KlenkeKAWN93,
author = {Robert H. Klenke and
Lori M. Kaufman and
James H. Aylor and
Ronald Waxman and
Padmini Narayan},
title = {Workstation Based Parallel Test Generation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {419--428},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470670},
doi = {10.1109/TEST.1993.470670},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KlenkeKAWN93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KonijnenburgLG93,
author = {M. H. Konijnenburg and
J. Th. van der Linden and
Ad J. van de Goor},
title = {Test Pattern Generation with Restrictors},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {598--605},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470644},
doi = {10.1109/TEST.1993.470644},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KonijnenburgLG93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KumarE93,
author = {Himanshu Kumar and
Scott A. Erjavic},
title = {Knowledge-Based Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {910--917},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470609},
doi = {10.1109/TEST.1993.470609},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KumarE93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KurzweilLBP93,
author = {E. Kurzweil and
M. Lallement and
R. Blanc and
R. Pasquinelli},
title = {Catch the Ground Bounce Before It Hits your System},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {574--584},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470652},
doi = {10.1109/TEST.1993.470652},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KurzweilLBP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KwangWHAN93,
author = {Kent Kwang and
Hsin Wang and
Arthur Hu and
Mitsuyuki Asaki and
Hironobu Niijima},
title = {CAD-Driven High-Precision E-Beam Positioning},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {928--935},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470607},
doi = {10.1109/TEST.1993.470607},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KwangWHAN93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Langford93,
author = {Tom Langford},
title = {Utilizing Boundary Scan to Implement {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {167--173},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470705},
doi = {10.1109/TEST.1993.470705},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Langford93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeathrumL93,
author = {James F. Leathrum and
K. A. Liburdy},
title = {The Evolving Role of Testing in Open Systems Standards},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {273--274},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470687},
doi = {10.1109/TEST.1993.470687},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeathrumL93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeathrumL93a,
author = {James F. Leathrum and
K. A. Liburdy},
title = {Automated Testing of Open Software Standards},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {854--858},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470616},
doi = {10.1109/TEST.1993.470616},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeathrumL93a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ledford93,
author = {Michael S. Ledford},
title = {Automotive Industry: The Next {DFT} Challenge},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {19},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Tue, 16 Apr 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Ledford93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lee93,
author = {Nai{-}Chi Lee},
title = {Practical Considerations for Mixed-Signal Test Bus},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {591--592},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470649},
doi = {10.1109/TEST.1993.470649},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lee93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeJW93,
author = {Tien{-}Chien Lee and
Niraj K. Jha and
Wayne H. Wolf},
title = {A Conditional Resource-Sharing Method for Behavior Synthesis of Highly-
Testable Data Paths},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {744--753},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470628},
doi = {10.1109/TEST.1993.470628},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeJW93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinZB93,
author = {Chih{-}Jen Lin and
Yervant Zorian and
Sudipta Bhawmik},
title = {{PSBIST:} {A} Partial-Scan Based Built-In Self-Test Scheme},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {507--516},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470660},
doi = {10.1109/TEST.1993.470660},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinZB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LittleburyB93,
author = {Hugh Littlebury and
Roger Brueckner},
title = {Integrating Electrical Test into Final Assembly},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {585--589},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470651},
doi = {10.1109/TEST.1993.470651},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LittleburyB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Long93,
author = {Michael A. Long},
title = {Software Regression Testing Success Story},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {271--272},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470688},
doi = {10.1109/TEST.1993.470688},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Long93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mahlstedt93,
author = {Udo Mahlstedt},
title = {{DELTEST:} Deterministic Test Generation for Gate-Delay Faults},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {972--980},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470602},
doi = {10.1109/TEST.1993.470602},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mahlstedt93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MahlstedtA93,
author = {Udo Mahlstedt and
J{\"{u}}rgen Alt},
title = {Simulation of non-classical Faults on the Gate Level - The Fault Simulator
{COMISM} -},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {883--892},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470612},
doi = {10.1109/TEST.1993.470612},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MahlstedtA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MatosLF93,
author = {Jos{\'{e}} Silva Matos and
Ana C. Le{\~{a}}o and
Jo{\~{a}}o Canas Ferreira},
title = {Control and Observation of Analog Nodes in Mixed-Signal Boards},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {323--331},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470681},
doi = {10.1109/TEST.1993.470681},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MatosLF93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maunder93,
author = {Colin M. Maunder},
title = {A Universal Framework for Managed Built-in Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {21--29},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470722},
doi = {10.1109/TEST.1993.470722},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maunder93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maunder93a,
author = {Colin M. Maunder},
title = {Position Statement: {ITC93} Boundary-Scan Panel},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {262},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Sun, 13 Sep 2015 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Maunder93a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maxwell93,
author = {Peter C. Maxwell},
title = {Let's Grade {ALL} the Faults},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {595},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470647},
doi = {10.1109/TEST.1993.470647},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maxwell93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellA93,
author = {Peter C. Maxwell and
Robert C. Aitken},
title = {Biased Voting: {A} Method for Simulating {CMOS} Bridging Faults in
the Presence of Variable Gate Logic},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {63--72},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470717},
doi = {10.1109/TEST.1993.470717},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MayrhauserO93,
author = {Anneliese von Mayrhauser and
Kurt M. Olender},
title = {Efficient Testing of Software Modifications},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {859--864},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470615},
doi = {10.1109/TEST.1993.470615},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MayrhauserO93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskey93,
author = {Edward J. McCluskey},
title = {Quality and Single-Stuck Faults},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {597},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470645},
doi = {10.1109/TEST.1993.470645},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskey93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MehtaniAJMSZ93,
author = {R. Mehtani and
Bert Atzema and
M. De Jonghe and
Richard Morren and
Geert Seuren and
Taco Zwemstra},
title = {Mix Test: {A} Mixed-Signal Extension to a Digital Test System},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {945--953},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470605},
doi = {10.1109/TEST.1993.470605},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MehtaniAJMSZ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Milne93,
author = {Kurt A. Milne},
title = {Automated Wafer Lot Approval: {A} Statistically Based Implementation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {92--98},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470714},
doi = {10.1109/TEST.1993.470714},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Milne93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MirandaL93,
author = {Miguel Miranda and
Carlos A. L{\'{o}}pez{-}Barrio},
title = {Generation of Optimized Single Distributions of Weights for Random
Built-in Self-Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {1023--1030},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470596},
doi = {10.1109/TEST.1993.470596},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MirandaL93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MirizziJO93,
author = {Douglas J. Mirizzi and
Willie Jerrels and
Dale Ohmart},
title = {Implementation of Parallelsite Test on an 8Bit Configurable Microcontroller},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {226--235},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470698},
doi = {10.1109/TEST.1993.470698},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MirizziJO93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoormanM93,
author = {Jan Moorman and
Steven D. Millman},
title = {Visualizing Test Information: {A} Novel Approach for Improving Testability},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {149--156},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470707},
doi = {10.1109/TEST.1993.470707},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoormanM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mosley93,
author = {Jim Mosley III},
title = {A Flexible Approach to Data Collection for Component Test Systems},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {461--470},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470665},
doi = {10.1109/TEST.1993.470665},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mosley93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MurisB93,
author = {Math Muris and
Alex S. Biewenga},
title = {Using Boundary Scan Test to Test Random Access Memory Clusters},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {174--179},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470704},
doi = {10.1109/TEST.1993.470704},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MurisB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NaiknawareNK93,
author = {Ravindranath Naiknaware and
G. N. Nandakumar and
Srinivasa Rao Kasa},
title = {Automatic Test Plan Generation for Analog and Mixed Signal Integrated
Circuits using Partial Activation and High Level Simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {139--148},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470708},
doi = {10.1109/TEST.1993.470708},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NaiknawareNK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NeebelK93,
author = {Danial J. Neebel and
Charles R. Kime},
title = {Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {1013--1022},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470597},
doi = {10.1109/TEST.1993.470597},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NeebelK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ODonnell93,
author = {John O'Donnell},
title = {Generated in Real-time Instant Process Statistics ("GRIPS"): Immediate,
Tester-computed Test Statistics, Eliminating the Post-processing of
Datalogs},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {471--477},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470664},
doi = {10.1109/TEST.1993.470664},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ODonnell93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OwnbyB93,
author = {David Ownby and
Harold Bogard},
title = {{FFT} Based Troubleshooting of 120dB Dynamic Range {ADC} Systems},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {690--696},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470634},
doi = {10.1109/TEST.1993.470634},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OwnbyB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkM93,
author = {Eun Sei Park and
M. Ray Mercer},
title = {Switch-Level {ATPG} Using Constraint-Guided Line Justification},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {616--625},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470642},
doi = {10.1109/TEST.1993.470642},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkerMO93,
author = {Kenneth P. Parker and
John E. McDermid and
Stig Oresjo},
title = {Structure and Metrology for an Analog Testability Bus},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {309--322},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470682},
doi = {10.1109/TEST.1993.470682},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkerMO93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PatelY93,
author = {Rajiv Patel and
Krishna Yarlagadda},
title = {Testability Features of the SuperSPARC\({}^{\mbox{tm}}\)},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {773--781},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470625},
doi = {10.1109/TEST.1993.470625},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PatelY93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PilarskiP93,
author = {Slawomir Pilarski and
Alicja Pierzynska},
title = {{BIST} and Delay Fault Detection},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {236--242},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470697},
doi = {10.1109/TEST.1993.470697},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PilarskiP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Poirier93,
author = {Christopher Poirier},
title = {{IEEE} {P1149.5} to 1149.1 Data and Protocol Conversion},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {527--535},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470658},
doi = {10.1109/TEST.1993.470658},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Poirier93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PomeranzR93,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {A Learning-Based Method to Match a Test Pattern Generator to a Circuit-Under-Test},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {998--1007},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470599},
doi = {10.1109/TEST.1993.470599},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PomeranzR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PramanickK93,
author = {Ankan K. Pramanick and
Sandip Kundu},
title = {Design of Scan-Based Path-Delay-Testable Sequential Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {962--971},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470603},
doi = {10.1109/TEST.1993.470603},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PramanickK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RearickP93,
author = {Jeff Rearick and
Janak H. Patel},
title = {Fast and Accurate {CMOS} Bridging Fault Simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {54--62},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470718},
doi = {10.1109/TEST.1993.470718},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RearickP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobinsonMK93,
author = {Markus Robinson and
Fr{\'{e}}d{\'{e}}ric Mailhot and
Jim Konsevich},
title = {Technology Independent Boundary Scan Synthesis (Technology and Physical
Issues)},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {157--166},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470706},
doi = {10.1109/TEST.1993.470706},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RobinsonMK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RosmalenBBJ93,
author = {M. M. A. van Rosmalen and
Keith Baker and
Eric Bruls and
Jochen A. G. Jess},
title = {Parameter Monitoring: Advantages and Pitfalls},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {115--124},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470711},
doi = {10.1109/TEST.1993.470711},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RosmalenBBJ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Roszel93,
author = {Lynn Roszel},
title = {{MCM} Foundry Test Methodology and Implementation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {369--372},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470676},
doi = {10.1109/TEST.1993.470676},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Roszel93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SachdevV93,
author = {Manoj Sachdev and
Math Verstraelen},
title = {Development of Fault Model and Test Algorithms for Embedded DRAMs},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {815--824},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470620},
doi = {10.1109/TEST.1993.470620},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SachdevV93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SakamotoC93,
author = {Paul Sakamoto and
Tom Chiu},
title = {High-Speed Sampling Capability for a {VLSI} Mixed-Signal Tester},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {918--927},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470608},
doi = {10.1109/TEST.1993.470608},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SakamotoC93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SasWHR93,
author = {Jos van Sas and
Geert van Wauwe and
Erik Huyskens and
Dirk Rabaey},
title = {{BIST} for Embedded Static RAMs with Coverage Calculation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {339--348},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470679},
doi = {10.1109/TEST.1993.470679},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SasWHR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaxenaP93,
author = {Jayashree Saxena and
Dhiraj K. Pradhan},
title = {A Method to Derive Compact Test Sets for Path Delay Faults in Combinational
Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {724--733},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470630},
doi = {10.1109/TEST.1993.470630},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SaxenaP93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ScholzAZ93,
author = {Harold N. Scholz and
Duane R. Aadsen and
Yervant Zorian},
title = {A Method for Delay Fault Self-Testing of Macrocells},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {253--261},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470695},
doi = {10.1109/TEST.1993.470695},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ScholzAZ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sheppard93,
author = {John W. Sheppard},
title = {Testing Fully Testable Systems: {A} Case Study},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {268},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470691},
doi = {10.1109/TEST.1993.470691},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sheppard93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SimpsonS93,
author = {William R. Simpson and
John W. Sheppard},
title = {The Impact of Commercial Off-The-Shelf {(COTS)} Equipment on System
Test and Diagnosis},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {30--36},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470721},
doi = {10.1109/TEST.1993.470721},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SimpsonS93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SodenH93,
author = {Jerry M. Soden and
Charles F. Hawkins},
title = {Quality Testing Requires Quality Thinking},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {596},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470646},
doi = {10.1109/TEST.1993.470646},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SodenH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Soma93,
author = {Mani Soma},
title = {Fault Coverage of {DC} Parametric Tests for Embedded Analog Amplifiers},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {566--573},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470653},
doi = {10.1109/TEST.1993.470653},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Soma93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sosnowski93,
author = {Janusz Sosnowski},
title = {"In System" Transparent Autodiagnostics of Rams},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {835--844},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470618},
doi = {10.1109/TEST.1993.470618},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sosnowski93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SrinivasanGB93,
author = {Rajagopalan Srinivasan and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {Novel Test Pattern Generators for Pseudo-Exhaustive Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {1041--1050},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470594},
doi = {10.1109/TEST.1993.470594},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SrinivasanGB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SteensmaCM93,
author = {Johannes Steensma and
Francky Catthoor and
Hugo De Man},
title = {Partial Scan at the Register-Transfer Level},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {488--497},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470662},
doi = {10.1109/TEST.1993.470662},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SteensmaCM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Storey93,
author = {Thomas M. Storey},
title = {A Test Methodology for {VLSI} Chips on Silicon},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {359--368},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470677},
doi = {10.1109/TEST.1993.470677},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Storey93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuH93,
author = {Chauchin Su and
Kychin Hwang},
title = {A Serial-Scan Test-Vector-Compression Methodology},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {981--988},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470601},
doi = {10.1109/TEST.1993.470601},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SullivanWM93,
author = {Gregory F. Sullivan and
Dwight S. Wilson and
Gerald M. Masson},
title = {Certification Trails and Software Design for Testability},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {200--209},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470701},
doi = {10.1109/TEST.1993.470701},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SullivanWM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Taylor93,
author = {Tony Taylor},
title = {Tools and Techniques for Converting Simulation Models into Test Patterns},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {133--138},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470709},
doi = {10.1109/TEST.1993.470709},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Taylor93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tegethoff93,
author = {Mick Tegethoff},
title = {{IEEE} 1149.1: How to Justify Implementation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {265},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Tue, 16 Apr 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Tegethoff93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Teramoto93,
author = {Mitsuo Teramoto},
title = {A Method for Reducing the Search Space in Test Pattern Generation},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {429--435},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470669},
doi = {10.1109/TEST.1993.470669},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Teramoto93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TeraokaKYIMWSST93,
author = {Eiichi Teraoka and
Toru Kengaku and
Ikuo Yasui and
Kazuyuki Ishikawa and
Takahiro Matsuo and
Hideyuki Wakada and
Narumi Sakashita and
Yukihiko Shimazu and
Takeshi Tokuda},
title = {A Built-in Self- Test for {ADC} and {DAC} in a Single-Chip Speech
{CODEC}},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {791--796},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470623},
doi = {10.1109/TEST.1993.470623},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TeraokaKYIMWSST93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thatcher93,
author = {Carl W. Thatcher},
title = {Design-For-Testability Economics},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {590},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470650},
doi = {10.1109/TEST.1993.470650},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thatcher93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ThatcherT93,
author = {Carl W. Thatcher and
Rodham E. Tulloss},
title = {Towards a Test Standard for Board and System Level Mixed-Signal Interconnects},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {300--308},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470683},
doi = {10.1109/TEST.1993.470683},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ThatcherT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TonerR93,
author = {Michael F. Toner and
Gordon W. Roberts},
title = {A {BIST} Scheme for an {SNR} Test of a Sigma-Delta {ADC}},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {805--814},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470621},
doi = {10.1109/TEST.1993.470621},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TonerR93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TreuerA93,
author = {Robert P. Treuer and
Vinod K. Agarwal},
title = {Fault Location Algorithms for Repairable Embedded},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {825--834},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470619},
doi = {10.1109/TEST.1993.470619},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TreuerA93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tulloss93,
author = {Rodham E. Tulloss},
title = {{IEEE} 1149 Standards - Changing Testing, Silicon to Systems},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {399--408},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470672},
doi = {10.1109/TEST.1993.470672},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Tulloss93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Turino93,
author = {Jon Turino},
title = {{DFT:} Profit or Loss -- {A} Position Paper},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {269},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470690},
doi = {10.1109/TEST.1993.470690},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Turino93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Varma93,
author = {Prab Varma},
title = {Scan {DFT:} Why More Can Cost Less},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {267},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470692},
doi = {10.1109/TEST.1993.470692},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Varma93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VarmaG93,
author = {Prab Varma and
Tushar Gheewala},
title = {Delay Testing Using a Matrix of Accessible Storage},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {243--252},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470696},
doi = {10.1109/TEST.1993.470696},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VarmaG93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VaucherB93,
author = {Christophe Vaucher and
Louis Balme},
title = {The Standard Mirror Boards (SMBs) Concept - An Innovative Improvement
of Traditional {ATE} for up to 10 Mil Bare Board Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {672--679},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470636},
doi = {10.1109/TEST.1993.470636},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VaucherB93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VierhausMG93,
author = {Heinrich Theodor Vierhaus and
Wolfgang Meyer and
Uwe Gl{\"{a}}ser},
title = {{CMOS} Bridges and Resistive Transistor Faults: I\({}_{\mbox{DDQ}}\)
versus Delay Effects},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {83--91},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470715},
doi = {10.1109/TEST.1993.470715},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VierhausMG93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VishakantaiahAS93,
author = {Praveen Vishakantaiah and
Jacob A. Abraham and
Daniel G. Saab},
title = {{CHEETA:} Composition of Hierarchical Sequential Tests Using {ATKET}},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {606--615},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470643},
doi = {10.1109/TEST.1993.470643},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VishakantaiahAS93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WagnerJ93,
author = {Russell J. Wagner and
Joel A. Jorgenson},
title = {Design-For-Test Techniques Utilized in an Avionics Computer {MCM}},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {373--382},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470675},
doi = {10.1109/TEST.1993.470675},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WagnerJ93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WagnerK93,
author = {Kenneth D. Wagner and
Bernd K{\"{o}}nemann},
title = {Testable Programmable Digital Clock Pulse Control Elements},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {902--909},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470610},
doi = {10.1109/TEST.1993.470610},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WagnerK93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WallquistRH93,
author = {Kenneth M. Wallquist and
Alan W. Righter and
Charles F. Hawkins},
title = {A General Purpose I\({}_{\mbox{DDQ}}\) Measurement Circuit},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {642--651},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470639},
doi = {10.1109/TEST.1993.470639},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WallquistRH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Whetsel93,
author = {Lee Whetsel},
title = {Hierarchically Accessing 1149.1 Applications in a System Environment},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {517--526},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470659},
doi = {10.1109/TEST.1993.470659},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Whetsel93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WilliamsH93,
author = {Richard H. Williams and
Charles F. Hawkins},
title = {The Economics of Guardband Placement},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {218--225},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470699},
doi = {10.1109/TEST.1993.470699},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WilliamsH93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wiscombe93,
author = {Paul C. Wiscombe},
title = {A Comparison of Stuck-At Fault Coverage and I\({}_{\mbox{DDQ}}\) Testing
on Defect Levels},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {293--299},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470684},
doi = {10.1109/TEST.1993.470684},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wiscombe93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1993,
title = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://ieeexplore.ieee.org/xpl/conhome/3304/proceeding},
isbn = {0-7803-1430-1},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/1993.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-04-24 11:39 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
