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@article{DBLP:journals/mr/BatunluA18,
author = {Canras Batunlu and
Al{-}Hussein Albarbar},
title = {Strategy for enhancing reliability and lifetime of {DC-AC} inverters
used for wind turbines},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {25--37},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.006},
doi = {10.1016/J.MICROREL.2018.04.006},
timestamp = {Tue, 21 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BatunluA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuYCLBHB18,
author = {Siyang Hu and
Chengdong Yuan and
Alessandro Castagnotto and
Boris Lohmann and
Sofiane Bouhedma and
Dennis Hohlfeld and
Tamara Bechtold},
title = {Stable reduced order modeling of piezoelectric energy harvesting modules
using implicit Schur complement},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {148--155},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.026},
doi = {10.1016/J.MICROREL.2018.03.026},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuYCLBHB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HylskySVCVV18,
author = {Josef Hylsk{\'{y}} and
D{\'{a}}vid Strachala and
Petr Vyroubal and
Pavel Cudek and
Jir{\'{\i}} Vanek and
Petr Van{\'{y}}sek},
title = {Effect of negative potential on the extent of {PID} degradation in
photovoltaic power plant in a real operation mode},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {12--18},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.003},
doi = {10.1016/J.MICROREL.2018.04.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HylskySVCVV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaramiAZ18,
author = {Masoomeh Karami and
Athena Abdi and
Hamid R. Zarandi},
title = {A cross-layer aging-aware task scheduling approach for multiprocessor
embedded systems},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {190--197},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.015},
doi = {10.1016/J.MICROREL.2018.04.015},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaramiAZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhatibiKL18,
author = {Golta Khatibi and
A. Betzwar Kotas and
Martin Lederer},
title = {Effect of aging on mechanical properties of high temperature Pb-rich
solder joints},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {1--11},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.009},
doi = {10.1016/J.MICROREL.2018.03.009},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhatibiKL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimYLKCCKK18,
author = {Junyeap Kim and
Hanbin Yoo and
Heesung Lee and
Seong Kwang Kim and
Sungju Choi and
Sung{-}Jin Choi and
Dae Hwan Kim and
Dong Myong Kim},
title = {Comprehensive separate extraction of parasitic resistances in MOSFETs
considering the gate bias-dependence and the asymmetric overlap length},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {66--70},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.011},
doi = {10.1016/J.MICROREL.2018.04.011},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimYLKCCKK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLX18,
author = {Yiyuan Li and
Jianhua Li and
Lixin Xu},
title = {Failure mode analysis of {MEMS} suspended inductors under mechanical
shock},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {38--48},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.041},
doi = {10.1016/J.MICROREL.2018.03.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiLX18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LoayzaGAPJG18,
author = {Jorge Loayza and
Nicolas Guitard and
Bruno Allard and
Luong{-}Vi{\^{e}}t Phung and
Blaise Jacquier and
Philippe Galy},
title = {Simulation, characterization and implementation of a new SCR-based
device with a turn-off capability for EOS-immune {ESD} power supply
clamps in advanced {CMOS} technology nodes},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {176--189},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.013},
doi = {10.1016/J.MICROREL.2018.04.013},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LoayzaGAPJG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/McWilliamKFB18,
author = {Richard McWilliam and
Samir Khan and
Michael Farnsworth and
Colin Bell},
title = {Zero-maintenance of electronic systems: Perspectives, challenges,
and opportunities},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {122--139},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.001},
doi = {10.1016/J.MICROREL.2018.04.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/McWilliamKFB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PalovicsER18,
author = {P{\'{e}}ter P{\'{a}}lovics and
Ferenc Ender and
M{\'{a}}rta Rencz},
title = {Towards the {CFD} model of flow rate dependent enzyme-substrate reactions
in nanoparticle filled flow microreactors},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {84--92},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.035},
doi = {10.1016/J.MICROREL.2018.03.035},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PalovicsER18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PohlKP18,
author = {L{\'{a}}szl{\'{o}} Pohl and
Zsolt Koh{\'{a}}ri and
Andr{\'{a}}s Poppe},
title = {Vertical natural convection models and their effect on failure analysis
in electro-thermal simulation of large-surface OLEDs},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {198--206},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.002},
doi = {10.1016/J.MICROREL.2018.05.002},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PohlKP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QuCLHLZ18,
author = {Yiming Qu and
Bing Chen and
Wei Liu and
Jinghui Han and
Jiwu Lu and
Yi Zhao},
title = {Sub-1{\unicode{8239}}ns characterization methodology for transistor
electrical parameter extraction},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {93--98},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.03.022},
doi = {10.1016/J.MICROREL.2018.03.022},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/QuCLHLZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RzepaFOSSHWJKWR18,
author = {Gerhard Rzepa and
Jacopo Franco and
Barry J. O'Sullivan and
A. Subirats and
Marko Simicic and
Geert Hellings and
Pieter Weckx and
Markus Jech and
Theresia Knobloch and
Michael Waltl and
Philippe Roussel and
Dimitri Linten and
Ben Kaczer and
Tibor Grasser},
title = {Comphy - {A} compact-physics framework for unified modeling of {BTI}},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {49--65},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.002},
doi = {10.1016/J.MICROREL.2018.04.002},
timestamp = {Sun, 19 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RzepaFOSSHWJKWR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SakamotoHS18,
author = {Junji Sakamoto and
Ryoma Hirata and
Tadahiro Shibutani},
title = {Potential failure mode identification of operational amplifier circuit
board by using high accelerated limit test},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {19--24},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.005},
doi = {10.1016/J.MICROREL.2018.04.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SakamotoHS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TilfordSLJBBB18,
author = {Tim Tilford and
Stoyan Stoyanov and
Jessica B. S. Langbaum and
Jan Christoph Janhsen and
Matthias Burgard and
Richard B. Buxton and
Chris Bailey},
title = {Design, manufacture and test for reliable 3D printed electronics packaging},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {109--117},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.008},
doi = {10.1016/J.MICROREL.2018.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TilfordSLJBBB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWZWZLF18,
author = {Zhihua Wang and
Qiong Wu and
Xiongjian Zhang and
Xinlei Wen and
Yongbo Zhang and
Chengrui Liu and
Huimin Fu},
title = {A generalized degradation model based on Gaussian process},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {207--214},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.05.001},
doi = {10.1016/J.MICROREL.2018.05.001},
timestamp = {Thu, 29 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangWZWZLF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WildLGZ18,
author = {Paul Wild and
Dominik Lorenz and
Tobias Gr{\"{o}}zinger and
Andr{\'{e}} Zimmermann},
title = {Effect of voids on thermo-mechanical reliability of chip resistor
solder joints: Experiment, modelling and simulation},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {163--175},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.014},
doi = {10.1016/J.MICROREL.2018.04.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WildLGZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YiD18,
author = {Shipeng Yi and
Zhengwei Du},
title = {The influence of microwave pulse width on the thermal burnout effect
of an {LNA} constructed by a GaAs {PHEMT}},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {140--147},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.016},
doi = {10.1016/J.MICROREL.2018.04.016},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YiD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YiD18a,
author = {Shipeng Yi and
Zhengwei Du},
title = {The influence of microwave pulse repetition frequency on the thermal
burnout effect of a {PIN} diode limiting-amplifying system},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {156--162},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.018},
doi = {10.1016/J.MICROREL.2018.04.018},
timestamp = {Tue, 16 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YiD18a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLLWZW18,
author = {Qingwei Zhang and
Ping Li and
Yongbo Liao and
Gang Wang and
Rongzhou Zeng and
Heng Wang},
title = {A reverse hysteresis effect of graphene transistors with amorphous
silicon gate dielectric},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {118--121},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.012},
doi = {10.1016/J.MICROREL.2018.04.012},
timestamp = {Thu, 19 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangLLWZW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangSDH18,
author = {Jian{-}Xun Zhang and
Xiao{-}Sheng Si and
Dang{-}Bo Du and
Chang{-}Hua Hu},
title = {Specification analysis of the deteriorating sensor for required lifetime
prognostic performance},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {71--83},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.004},
doi = {10.1016/J.MICROREL.2018.04.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangSDH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoQZF18,
author = {Qi Zhao and
Xiaoli Qin and
Hongbo Zhao and
Wenquan Feng},
title = {A novel prediction method based on the support vector regression for
the remaining useful life of lithium-ion batteries},
journal = {Microelectron. Reliab.},
volume = {85},
pages = {99--108},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2018.04.007},
doi = {10.1016/J.MICROREL.2018.04.007},
timestamp = {Tue, 05 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoQZF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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