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@article{DBLP:journals/mr/ChoiYAKBK18,
  author       = {Kyeonggon Choi and
                  Dong{-}Youl Yu and
                  Sungdo Ahn and
                  Kyoung{-}Ho Kim and
                  Jung{-}Hwan Bang and
                  Yong{-}Ho Ko},
  title        = {Joint reliability of various Pb-free solders under harsh vibration
                  conditions for automotive electronics},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {66--71},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.006},
  doi          = {10.1016/J.MICROREL.2018.05.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChoiYAKBK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HaniniA18,
  author       = {Wasma Hanini and
                  Moez Ayadi},
  title        = {Electro thermal modeling of the power diode using Pspice},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {82--91},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.008},
  doi          = {10.1016/J.MICROREL.2018.05.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HaniniA18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/JanickiTSRN18,
  author       = {Marcin Janicki and
                  Tomasz Torzewicz and
                  Agnieszka Samson and
                  Tomasz Raszkowski and
                  Andrzej Napieralski},
  title        = {Experimental identification of {LED} compact thermal model element
                  values},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {20--26},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.003},
  doi          = {10.1016/J.MICROREL.2018.05.003},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/JanickiTSRN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/KristofikBM18,
  author       = {Stefan Kristof{\'{\i}}k and
                  Marcel Bal{\'{a}}z and
                  Peter Mal{\'{\i}}k},
  title        = {Hardware redundancy architecture based on reconfigurable logic blocks
                  with persistent high reliability improvement},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {38--53},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.04.010},
  doi          = {10.1016/J.MICROREL.2018.04.010},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KristofikBM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiLZPWY18,
  author       = {Ting Li and
                  Zebin Li and
                  Ke Zhao and
                  Boan Pan and
                  Zhiyuan Wang and
                  Xiping Yang},
  title        = {Reliability analysis of a mini-instrument for simultaneous monitoring
                  water content, deep tissue temperature, and hemodynamic parameters},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {72--76},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.009},
  doi          = {10.1016/J.MICROREL.2018.05.009},
  timestamp    = {Thu, 22 Oct 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LiLZPWY18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/MartinezAREO18,
  author       = {Jorge Mart{\'{\i}}nez and
                  Mert Atamaner and
                  Pedro Reviriego and
                  Oguz Ergin and
                  Marco Ottavi},
  title        = {Opcode vector: An efficient scheme to detect soft errors in instructions},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {92--97},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.03.017},
  doi          = {10.1016/J.MICROREL.2018.03.017},
  timestamp    = {Thu, 17 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MartinezAREO18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/MikkonenM18,
  author       = {Riikka Mikkonen and
                  Matti M{\"{a}}ntysalo},
  title        = {Evaluation of screen printed silver trace performance and long-term
                  reliability against environmental stress on a low surface energy substrate},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {54--65},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.010},
  doi          = {10.1016/J.MICROREL.2018.05.010},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MikkonenM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/NguyenDNTDPN18,
  author       = {Nam Nguyen and
                  Van{-}Quyen Dinh and
                  Tung Nguyen{-}Duc and
                  Quoc{-}Tuan Ta and
                  Xuan{-}Viet Dao and
                  Thanh{-}Huy Pham and
                  Trung{-}Kien Nguyen{-}Duc},
  title        = {Effect of potting materials on {LED} bulb's driver temperature},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {77--81},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.012},
  doi          = {10.1016/J.MICROREL.2018.05.012},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/NguyenDNTDPN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/RaszkowskiSZ18,
  author       = {Tomasz Raszkowski and
                  Agnieszka Samson and
                  Mariusz Zubert},
  title        = {Influence of temperature and heat flux time lags on the temperature
                  distribution in modern {GAAFET} structure based on Dual-Phase-Lag
                  thermal model},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {10--19},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.004},
  doi          = {10.1016/J.MICROREL.2018.05.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RaszkowskiSZ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WanLHQXLJ18,
  author       = {Yongqiang Wan and
                  Shuang Li and
                  Xiaowu Hu and
                  Yu Qiu and
                  Tao Xu and
                  Yulong Li and
                  Xiongxin Jiang},
  title        = {Shear strength and fracture surface analysis of Sn58Bi/Cu solder joints
                  under a wide range of strain rates},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {27--37},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.007},
  doi          = {10.1016/J.MICROREL.2018.05.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WanLHQXLJ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WlanisHELSGRM18,
  author       = {Thomas Wlanis and
                  Ren{\'{e}} Hammer and
                  Werner Ecker and
                  Sandrine Lhostis and
                  Cl{\'{e}}ment Sart and
                  S{\'{e}}bastien Gallois{-}Garreignot and
                  Bernhard Rebhan and
                  G{\"{u}}nther A. Maier},
  title        = {Cu-SiO2 hybrid bonding simulation including surface roughness and
                  viscoplastic material modeling: {A} critical comparison of 2D and
                  3D modeling approach},
  journal      = {Microelectron. Reliab.},
  volume       = {86},
  pages        = {1--9},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.05.005},
  doi          = {10.1016/J.MICROREL.2018.05.005},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WlanisHELSGRM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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