27th Asian Test Symposium 2018: Hefei, China

Session 1A: 3D/NOC Testing

Session 1B: Memory BIST and Logic BIST

Session 2A: DFT and Secure DFT

Session 2B: Design on FPGAs

Session 3A: Hardware Trojan Design and Detection

Session 3B: Aging Analysis and Minimization

Session 4A: Design for Hardware Security

Session 4B: Fault Tolerance and Error Tolerance

Session 5A: Low Power Design and Testing

Session 5B: Reliable Memory

Session 6A: Design and Test for Emerging Technologies

Session 6B: Mixed Signal Designs and ATE

a service of Schloss Dagstuhl - Leibniz Center for Informatics