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ORCIDDSA 2018: Dalian, China
- 5th International Conference on Dependable Systems and Their Applications, DSA 2018, Dalian, China, September 22-23, 2018. IEEE 2018, ISBN 978-1-5386-9266-0
- Xin Li, Hua Vy Le Thanh, Yuxin Deng, Julian Dolby:
Generating Permission-Based Security Policies. 1-7 - Yan Hu, Weiqiang Kong, Deng Ding, Jun Yan:
Method-Level Permission Analysis Based on Static Call Graph of Android Apps. 8-14 - Congcong Ye, Guoqiang Li, Hongming Cai, Yonggen Gu, Akira Fukuda:
Analysis of Security in Blockchain: Case Study in 51%-Attack Detecting. 15-24 - Wei-Tek Tsai, Zihao Zhao, Chi Zhang, Lian Yu, Enyan Deng:
A Multi-Chain Model for CBDC. 25-34 - David Tian, Jiamei Deng, Enrico Zio, Francesco Di Maio
, Fucheng Liao:
Failure Modes Detection of Nuclear Systems Using Machine Learning. 35-43 - Wei Jiang, Siwei Zhou, Luyao Ye, Dongdong Zhao, Jing Tian, W. Eric Wong, Jianwen Xiang:
An Algebraic Binary Decision Diagram for Analysis of Dynamic Fault Tree. 44-51 - Jinyong Yao, Zhiping Pang:
A GTS-Based Reliability Analysis Method for the Subsea Gas Boosting System. 52-57 - Yingjie Ren, Yanguang Hu:
Failure Diagnosis for UAV-Born Inertial Navigation Device Based on BP-Adaboost Model. 58-64 - Han Wang, Zhilei Ren, Xiaochen Li, He Jiang:
Solving Team Making Problem for Crowdsourcing with Evolutionary Strategy. 65-74 - Tianjiao Niu, Yusi Ding, Jianzheng Yang:
Comparative Study on Online Review of Different Types of Hotel. 75-79 - Chenghao Han, Zhongtao Wang, Longxu Wang:
Indoor Positioning System Based on Zigbee and Inertial System. 80-85 - Yanhe Cui, Jun Yang:
Interval Estimation of Process Capability Indices Based on the Weibull Distributed Quality Data of Supplier Products. 86-90 - Lixiang Wang, Wei Dai, Yubing Huang:
Process Capability Evaluation of Product Development Based on Information Entropy. 91-95 - Bo Jiang, Xiaoyan Wang, Huanqiang Xu, Hao Wang, Chaoyang Zhang:
Nondeterministic Event Sequence Reduction for Android Applications. 96-101 - Linghuan Hu, W. Eric Wong, D. Richard Kuhn, Raghu Kacker:
MCDC-Star: A White-Box Based Automated Test Generation for High MC/DC Coverage. 102-112 - Yanhong Xu, Beibei Yin, Xiaohui Wan, Chenglong Li, Zheng Zheng:
A Theoretical Analysis on the Impacts of Misestimated Test Cases. 113-118 - Ang Li, Yi Ren, Dezhen Yang, Zhifeng Li:
A Monte Carlo Simulation-Based Algorithm for a Repairable System in GO Methodology. 119-125 - Yati Phyo, Kazuhiro Ogata:
Analysis of Some Variants of the Anderson Array-Based Queuing Mutual Exclusion Protocol with Model Checking and Graphical Animations. 126-135 - Shouki Sakamoto, Kazuhiro Ogata:
Model Checking of the Suzuki-Kasami Distributed Mutual Exclusion Algorithm with SPIN. 136-141 - Takahiro Ando, Bo Wang, Kenji Hisazumi, Weiqiang Kong, Akira Fukuda, Yasutaka Michiura, Keita Sakemi, Michihiro Matsumoto:
Verification Model Translation Method toward Behavior Model for CAST. 142-147
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