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15th FDTC 2018: Amsterdam, The Netherlands

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2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, FDTC 2018, Amsterdam, The Netherlands, September 13, 2018. IEEE Computer Society 2018, ISBN 978-1-5386-8197-8

Session 1: Laser Fault Attacks

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Jean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre:
Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model. 1-6
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Bodo Selmke, Kilian Zinnecker, Philipp Koppermann, Katja Miller, Johann Heyszl, Georg Sigl:
Locked out by Latch-up? An Empirical Study on Laser Fault Injection into Arm Cortex-M Processors. 7-14

Session 2: Fault Attacks and Countermeasures

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Sayandeep Saha, Dirmanto Jap, Jakub Breier, Shivam Bhasin, Debdeep Mukhopadhyay, Pallab Dasgupta:
Breaking Redundancy-Based Countermeasures with Random Faults and Power Side Channel. 15-22
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Vittorio Zaccaria, Maria Chiara Molteni, Filippo Melzani, Guido Bertoni:
Darth's Saber: A Key Exfiltration Attack for Symmetric Ciphers Using Laser Light. 23-26
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Victor Arribas, Thomas De Cnudde, Danilo Sijacic:
Glitch-Resistant Masking Schemes as Countermeasure Against Fault Sensitivity Analysis. 27-34

Session 3: Electromagnetic Fault Attacks

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Antun Maldini, Niels Samwel, Stjepan Picek, Lejla Batina:
Genetic Algorithm-Based Electromagnetic Fault Injection. 35-42
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Maxime Madau, Michel Agoyan, Josep Balasch, Milos Grujic, Patrick Haddad, Philippe Maurine, Vladimir Rozic, Dave Singelée, Bohan Yang, Ingrid Verbauwhede:
The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators. 43-48

Panel Contribution

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Sylvain Guilley, Youssef El Housni:
Random Numbers Generation: Tests and Attacks. 49-54

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