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ORCIDInternational Workshop on Metamorphic Testing (MET)
8th MET@ICSE 2023: Melbourne, Australia
- 8th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2023, Melbourne, Australia, May 14, 2023. IEEE 2023, ISBN 979-8-3503-0176-2 [contents]
7th MET@ICSE 2022: Pittsburgh, PA, USA
- IEEE/ACM 7th International Workshop on Metamorphic Testing, MET@ICSE 2022, Pittsburgh, PA, USA, May 9, 2022. ACM 2022, ISBN 978-1-4503-9307-2 [contents]
6th MET@ICSE 2021: Madrid, Spain
- 6th IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2021, Madrid, Spain, June 2, 2021. IEEE 2021, ISBN 978-1-6654-4464-4 [contents]
5th MET@ICSE 2020: Seoul, Korea
- ICSE '20: 42nd International Conference on Software Engineering, Workshops, Seoul, Republic of Korea, 27 June - 19 July, 2020. ACM 2020, ISBN 978-1-4503-7963-2 [contents]
4th MET@ICSE 2019: Montreal, QC, Canada
- Xiaoyuan Xie, Pak-Lok Poon, Laura L. Pullum:
Proceedings of the 4th International Workshop on Metamorphic Testing, MET@ICSE 2019, Montreal, QC, Canada, May 26, 2019. IEEE / ACM 2019, ISBN 978-1-7281-2235-9 [contents]
3rd MET@ICSE 2018: Gothenburg, Sweden
- Xiaoyuan Xie, Laura L. Pullum, Pak-Lok Poon:
3rd IEEE/ACM International Workshop on Metamorphic Testing, MET 2018, Gothenburg, Sweden, May 27, 2018. ACM 2018, ISBN 978-1-4503-5729-6 [contents]
2nd MET@ICSE 2017: Buenos Aires, Argentina
- 2nd IEEE/ACM International Workshop on Metamorphic Testing, MET@ICSE 2017, Buenos Aires, Argentina, May 22, 2017. IEEE Computer Society 2017, ISBN 978-1-5386-0424-3 [contents]
1st MET@ICSE 2016: Austin, Texas, USA
- Proceedings of the 1st International Workshop on Metamorphic Testing, MET@ICSE 2016, Austin, Texas, USA, May 16, 2016. ACM 2016, ISBN 978-1-4503-4163-9 [contents]
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