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ORCID5th ISSRE 1994: Monterey, CA, USA
- 5th International Symposium on Software Reliability Engineering, ISSRE 1994, Monterey, CA, USA, November 6-9, 1994. IEEE Computer Society 1994, ISBN 0-8186-6665-X
- Rong-Huei Hou, Sy-Yen Kuo, Yi-Ping Chang:
Applying various learning curves to hyper-geometric distribution software reliability growth model. 8-17 - Denise M. Woit:
A framework for reliability estimation. 18-24 - R. Follenweider, Richard M. Karcich, George J. Knafl:
An exploratory analysis of system test data. 25-34 - Joanne Bechta Dugan:
Experimental analysis of models for correlation in multiversion software. 36-44 - Ramin Mojdehbakhsh, Satish Subramanian, Ramakrishna V. Vishnuvajjala, Wei-Tek Tsai, Lynn Elliott:
A process for software requirements safety analysis. 45-54 - Mladen A. Vouk, Kuo-Chung Tai, Amit M. Paradkar:
Empirical studies of predicate-based software testing. 55-64 - Michael R. Lyu:
Software reliability: to use or not to use? 66-73 - Edward A. Addy:
Methodology of independent software nuclear safety analysis. 76-83 - Herbert Hecht, Myron Hecht:
V&V in defense and commercial projects. 84-92 - Farokh B. Bastani, Alberto Pasquini:
Assessment of a sampling method for measuring safety-critical software reliability. 93-102 - Taghi M. Khoshgoftaar, David L. Lanning:
On the impact of software product dissimilarity on software quality models. 104-114 - Frank D. Anger, John C. Munson, Rita V. Rodríguez:
Temporal complexity and software faults. 115-125 - Kanupriya Tewary, Mary Jean Harrold:
Fault modeling using the program dependence graph. 126-135 - William E. Howden, Yudong Huang:
Software trustability. 143-151 - Jeffrey M. Voas, Keith W. Miller:
Putting assertions in their place. 152-157 - Dick Hamlet:
Connecting test coverage to software dependability. 158-165 - Alberto Avritzer, Elaine J. Weyuker:
Estimating the software reliability of smoothly degrading systems. 168-177 - P. K. Kapur, P. S. Grover, S. Younes:
Modelling an imperfect debugging phenomenon with testing effort. 178-183 - Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich, Bob Skibbe:
The relationship between test coverage and reliability. 186-195 - Michael Naixin Li, Yashwant K. Malaiya:
On input profile selection for software testing. 196-205 - Anneliese von Mayrhauser, Jeff Walls, Richard T. Mraz:
Testing applications using domain based testing and Sleuth. 206-215 - Sandra Camargo Pinto Ferraz Fabbri, Márcio Eduardo Delamaro, José Carlos Maldonado, Paulo César Masiero:
Mutation analysis testing for finite state machines. 220-229 - W. Eric Wong, Joseph R. Horgan, Saul London, Aditya P. Mathur:
Effect of test set size and block coverage on the fault detection effectiveness. 230-238 - Farid Ouabdesselam, Ioannis Parissis:
Testing synchronous critical software. 239-248 - Christian Antoine, Patrick Baudin, J. M. Collart, Jacques Raguideau, A. Trotin:
Using formal methods to validate C programs. 252-258 - Jacques Raguideau, Dominique Schoen, Jean-Yves Henry, Jacques Boulc'h:
CLAIRE: an event-driven simulation tool for testing software. 259-263 - Robert C. Tausworthe, Michael R. Lyu:
A generalized software reliability process simulation technique and tool. 264-273 - Mei-Hwa Chen, Aditya P. Mathur, Vernon Rego:
A case study to investigate sensitivity of reliability estimates to errors in operational profile. 276-281 - Ram Chillarege, Shriram Biyani:
Identifying risk using ODC based growth models. 282-288 - Alex Elentukh:
System reliability policy at Motorola Codex. 289-293 - Frédérique Vallée, A. Ragot:
FIABILOG: a software reliability tool and its application to space projects. 296-302 - David M. Cohen, Siddhartha R. Dalal, A. Kajla, Gardner C. Patton:
The Automatic Efficient Test Generator (AETG) system. 303-309 - Staffan Pernler, Niclas Stahl:
An automated environment for software testing and reliability estimation. 312-317 - Tim Raske, Martin Marietta:
More efficient software testing through the application of design of experiments (DOE). 318-322 - Alberto Pasquini:
Reliability growth modelling of software for process control systems. 323-328 - John D. Musa:
Adjusting measured field failure intensity for operational profile variation. 330-333 - John D. Musa:
Sensitivity of field failure intensity to operational profile errors. 334-337 - Mary Ann Hoppa, Larry W. Wilson:
Some effects of fault recovery order on software reliability models. 338-342 - James O. Wilder:
Assessing the dynamic strength of software systems using interference analysis. 343-348
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