


default search action
6th ISSRE 1995: Toulouse, France
- Sixth International Symposium on Software Reliability Engineering, ISSRE 1995, Toulouse, France, October 24-27, 1995. IEEE Computer Society 1995, ISBN 0-8186-7131-9

- Jean-Claude Laprie:

Dependability of computer systems: concepts, limits, improvements. 2-11 - Christof Ebert, Thomas Liedtke:

An integrated approach for criticality prediction. 14-23 - Taghi M. Khoshgoftaar, Edward B. Allen, Kalai Kalaichelvan, Nishith Goel, John P. Hudepohl, Jean Mayrand:

Detection of fault-prone program modules in a very large telecommunications system. 24-33 - Yasunari Takagi, Toshifumi Tanaka, Naoki Niihara, Keishi Sakamoto, Shinji Kusumoto, Tohru Kikuno:

Analysis of review's effectiveness based on software metrics. 34-39 - Anshuman Thakur, Ravishankar K. Iyer, Luke T. Young, Inhwan Lee:

Analysis of failures in the Tandem NonStop-UX Operating System. 40-50 - David Hamilton, Richard Covington, Alice T. Lee:

An experience report on requirements reliability engineering using formal methods. 52-57 - Hélène Waeselynck, Jean-Louis Boulanger:

The role of testing in the B formal development process. 58-67 - Fevzi Belli, Javier Dreyer:

Systems specification, analysis, and validation by means of timed predicate/transition nets and logic programming. 68-77 - Eun Mi Kim, Shinji Kusumoto, Tohru Kikuno:

An approach to safety and correctness verification of software design specification. 78-83 - Yashwant K. Malaiya:

Antirandom testing: getting the most out of black-box testing. 86-95 - Richard T. Mraz, Adele E. Howe, Anneliese von Mayrhauser, Li Li:

System testing with an AI planner. 96-105 - Amit M. Paradkar, Kuo-Chung Tai:

Test generation for Boolean expressions. 106-115 - Fabio Del Frate, Praerit Garg, Aditya P. Mathur, Alberto Pasquini:

On the correlation between code coverage and software reliability. 124-132 - Fevzi Belli, Oliver Jack:

A test coverage notion for logic programming. 133-142 - Hiralal Agrawal, Joseph R. Horgan, Saul London, W. Eric Wong:

Fault localization using execution slices and dataflow tests. 143-151 - P. K. Mangan, Bryant Cruse, J. P. VanBlois, Haim Levendel, Jean-Michel Nogue:

Software Reliability in COTS-Based Systems. 154-157 - Algirdas Avizienis:

Dependable computing depends on structured fault tolerance. 158-168 - John F. Meyer, Bev Littlewood, David Wright:

Dependability of modular software in a multiuser operational environment. 170-179 - Sachin Garg, Antonio Puliafito, Miklós Telek, Kishor S. Trivedi:

Analysis of software rejuvenation using Markov Regenerative Stochastic Petri Net. 180-187 - Min Xie, Claes Wohlin:

An additive reliability model for the analysis of modular software failure data. 188-194 - Rong-Huei Hou, Sy-Yen Kuo, Yi-Ping Chang:

Hyper-geometric distribution software reliability growth model with imperfect debugging. 195-200 - Kazuyuki Shima, Ken-ichi Matsumoto, Koji Torii:

A new method for increasing the reliability of multiversion software systems using software breeding. 202-208 - Katerina Goseva-Popstojanova, Aksenti Grnarov:

Performability modeling of N version programming technique. 209-218 - Krassimir Djambazov, Peter T. Popov:

The effect of testing on the reliability of single version and 1-out-of-2 software systems. 219-228 - Jeffrey M. Voas, Keith W. Miller:

Predicting software's minimum-time-to-hazard and mean-time-to-hazard for rare input events. 229-238 - Robert M. Szabo, Taghi M. Khoshgoftaar:

An assessment of software quality in a C++ environment. 240-249 - Takamasa Nara, Masahiro Nakata, Akihiro Ooishi:

Software reliability growth analysis: application of NHPP models and its evaluation. 250-255 - Walter Baziuk:

BNR/NORTEL: path to improve product quality, reliability and customer satisfaction. 256-262 - M. Ohba:

Software Error Data Collection and Analysis in Industry. 270-273 - H. Buczilowski:

Defect reduction in VSE-methodology and results. 274-277 - Yves Le Traon, Chantal Robach:

Towards a unified approach to the testability of co-designed systems. 278-285 - Farid Ouabdesselam, Ioannis Parissis:

Constructing operational profiles for synchronous critical software. 286-293 - D. Pérez:

Dependability of safety-critical systems: contribution of the synchronous approach. 296-301 - Allen P. Nikora, Michael R. Lyu:

An experiment in determining software reliability model applicability. 304-313 - M. Hlady, R. Kovacevic, J. Jenny Li, Barry R. Pekilis, D. Prairie, Tony Savor, Rudolph E. Seviora, D. A. Simser, Alexandre Vorobiev:

An approach to automatic detection of software failures. 314-323 - Takashi Minohara, Yoshihiro Tohma:

Parameter estimation of hyper-geometric distribution software reliability growth model by genetic algorithms. 324-329 - Robert E. Loesh, Arthur B. Gosnell, James D. Johannes, Richard M. Wyskida, Stephen E. Zutaut:

MICOM IV&V planning approach and experience involving software reliability. 330-336 - B. D. Jensen:

A software reliability engineering success story. AT&T's Definity PBX. 338-343 - D. A. Kropfl, Willa K. Ehrlich:

Telecommunications network operations systems: experiences in software reliability engineering. 344-349 - D. W. Carman, Adrian A. Dolinsky, Michael R. Lyu, Jinsong S. Yu:

Software reliability engineering study of a large-scale telecommunications software system. 350-359 - Paul H. Franklin:

An analysis of system level software availability during test. 360-365 - Michael Carr:

A data analysis and representation engine to support software reliability engineering. 368-374 - Michael Naixin Li, Yashwant K. Malaiya:

ROBUST: a next generation software reliability engineering tool. 375-380 - Frédérique Vallée, Bertrand Gayet, Henri Derriennic, Gilbert Le Gall:

M-elopee: a CASE tool for software reliability study. 381-386 - Ammar Attoui, David R. C. Hill:

A specification and validation method to improve concurrent systems reliability based on object messaging and rewriting logic. 387-392

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID














