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ORCID11th LATW 2010: Punta del Este, Uruguay
- 11th Latin American Test Workshop, LATW 2010, Punta del Este, Uruguay, March 28-30, 2010. IEEE 2010, ISBN 978-1-4244-7786-9
- Emmanuel Simeu:
Embedded test and control of analogue/RF circuits using intelligent resources. 1-2 - Frédéric Wrobel:
Manufacturers to end-users tools for radiations induced reliability issues in electronic devices. 1 - Sergio Bampi:
Heterogeneous integration: Beyond CMOS - coping with variability at the end of the CMOS roadmap. 1 - Guillermo Avendaño, Pablo Fuentes, Víctor Castillo, Constanza Garcia, Natalie Dominguez:
Reliability and safety of medical equipment by use of calibration and certification instruments. 1-4 - Nicola Nicolici:
On improving real-time observability for in-system post-silicon debug. 1 - Gustavo Wilke, Ricardo Reis
:
Variability-aware physical design techniques. 1 - Bernard Courtois:
ICs and MEMS for energy management. 1 - Yu Zhang, Vishwani D. Agrawal:
An algorithm for diagnostic fault simulation. 1-5 - José Rodrigo Azambuja, Fernando Sousa, Lucas Rosa, Fernanda Lima Kastensmidt:
The limitations of software signature and basic block sizing in soft error fault coverage. 1-8 - Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Diversity TMR: Proof of concept in a mixed-signal case. 1-6 - Carlos Ivan Castro Marquez, Marius Strum, Wang Jiang Chau:
Automatic generation of a parameter-domain-based functional input coverage model. 1-6 - Ariel P. Cédola, Marcelo A. Cappelletti, Eitel L. Peltzer y Blancá:
A method for improving the radiation tolerance of PIN photodiodes by optimization of n- layer thickness and light wavelength. 1-4 - Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas:
BICS-based March test for resistive-open defect detection in SRAMs. 1-6 - Maximiliano Cristiá, Valdivino Alexandre de Santiago Jr., Nandamudi L. Vijaykumar:
On Comparing and Complementing two MBT approaches. 1-6 - John M. Espinosa-Duran, Vladimir Trujillo-Olaya, Jaime Velasco-Medina, Raoul Velazco:
Bit-flip injection strategies for FSMs modeled in VHDL behavioral level. 1-5 - Gilles Foucard, Paul Peronnard, Raoul Velazco:
Reliability limits of TMR implemented in a SRAM-based FPGA: Heavy ion measures vs. fault injection predictions. 1-5 - Luiz Fernando Gonçalves, Eduardo Luis Schneider, Renato Ventura Bayan Henriques, Marcelo Lubaszewski, Jefferson Luiz Bosa, Paulo Martins Engel:
Fault prediction in electrical valves using temporal Kohonen maps. 1-6 - Michelangelo Grosso, Wilson J. Pérez H., Danilo Ravotto, Ernesto Sánchez, Matteo Sonza Reorda, Jaime Velasco-Medina:
Functional test generation for DMA controllers. 1-6 - Fiorella Haim, Andrés Bergeret, Alejandra González, Ignacio Benavente:
Procedures and lab setup developed to test MIFARE based transportation devices compliance. 1-5 - Hanno Hantson, Jaan Raik, Maksim Jenihhin, Anton Chepurov, Raimund Ubar, Giuseppe Di Guglielmo, Franco Fummi:
Mutation analysis with high-level decision diagrams. 1-6 - Marcos Hervé, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski:
Concurrent test of Network-on-Chip interconnects and routers. 1-6 - Felipe Lavratti, Alex R. Pinto, Dárcio Prestes, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Montez:
Towards a transmission power self-optimization in reliable Wireless Sensor Networks. 1-3 - José Erick de Souza Lima, Carlos A. dos Reis Filho:
Automated test-bed for analog to digital converters. 1-5 - Mohamed Mabrouk:
RF and Microwave production test requirements for advanced mixed-signal devices. 1-4 - Alfredo Olmos, Andre Vilas Boas, Eduardo Ribeiro da Silva, José Carlos da Silva, Ricardo Maltione:
Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization. 1-3 - Marcelo Marinho, Paulo Maciel, Erica Sousa, Teresa Maciel, Ermeson C. Andrade:
Performance evaluation model for test process. 1-6 - Pedro Martinez-Julia, Antonio Fernandez Gómez-Skarmeta:
Performance testing of distributed block-oriented storage over IP networks. 1-4 - Jorge Moreno, Osvaldo González, Rafael Vega, Rogelio Palomera, Manuel Jiménez:
Emulating an Agilent™ 4142 on a Keithley™ 2600 series Source Measurement Unit. 1-3 - Ruthiano S. Munaretti, Bruno Coswig Fiss, Taisy Silva Weber, Sérgio Luis Cechin:
Experimental dependability assessment using a faultload specification tool. 1-6 - Muhammad Mudassar Nisar, Jayaram Natarajan, Abhijit Chatterjee:
Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing. 1-6 - Gustavo M. Oliveira, Sérgio Luis Cechin, Taisy Silva Weber:
Dependability evaluation of distributed systems through partitioning fault injection. 1-6 - Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir:
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. 1-7 - Jimmy Tarrillo, Carlos Arthur Lang Lisbôa, Luigi Carro, Costas Argyrides, Dhiraj K. Pradhan:
Evaluation of a new low cost software level fault tolerance technique to cope with soft errors. 1-3 - Lucas Torri, Guilherme Fachini, Leonardo Steinfeld, Vesmar Camara, Luigi Carro, Érika F. Cota:
An evaluation of free/open source static analysis tools applied to embedded software. 1-6 - Vladimir Trujillo-Olaya, John M. Espinosa-Duran, Jaime Velasco-Medina, Raoul Velazco:
Dependability validation of a cryptoprocessor to SEU effects. 1-6 - Hector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura:
Reliability analysis of small delay defects in vias located in signal paths. 1-6 - Edson Vinci, Osamu Saotome:
Reliability of on-board computer for ITASAT university satellite. 1-3
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