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IEEE International Conference on RFID (RFID)
IEEE RFID 2025: Atlanta, GA, USA
- IEEE International Conference on RFID, RFID 2025, Atlanta, GA, USA, April 22-24, 2025. IEEE 2025, ISBN 979-8-3315-0905-7 [contents]

IEEE RFID 2024: Cambridge, MA, USA
- IEEE International Conference on RFID, RFID 2024, Cambridge, MA, USA, June 4-6, 2024. IEEE 2024, ISBN 979-8-3503-7359-2 [contents]

IEEE RFID 2023: Seattle, WA, USA
- IEEE International Conference on RFID, RFID 2023, Seattle, WA, USA, June 13-15, 2023. IEEE 2023, ISBN 979-8-3503-3551-4 [contents]

IEEE RFID 2022: Las Vegas, NV, USA
- IEEE International Conference on RFID, RFID 2022, Las Vegas, NV, USA, May 17-19, 2022. IEEE 2022, ISBN 978-1-6654-1046-5 [contents]

IEEE RFID 2021: Atlanta, GA, USA
- IEEE International Conference on RFID, RFID 2021, Atlanta, GA, USA, April 27-29, 2021. IEEE 2021, ISBN 978-1-6654-4090-5 [contents]

IEEE RFID 2020: Orlando, FL, USA
- IEEE International Conference on RFID, RFID 2020, Orlando, FL, USA, September 28 - October 16, 2020. IEEE 2020, ISBN 978-1-7281-5576-0 [contents]

IEEE RFID 2019: Phoenix, AZ, USA
- IEEE International Conference on RFID, RFID 2019, Phoenix, AZ, USA, April 2-4, 2019. IEEE 2019, ISBN 978-1-7281-1210-7 [contents]

IEEE RFID 2018: Orlando, FL, USA
- 2018 IEEE International Conference on RFID, RFID 2018, Orlando, FL, USA, April 10-12, 2018. IEEE 2018, ISBN 978-1-5386-1456-3 [contents]

IEEE RFID 2017: Phoenix, AZ, USA
- 2017 IEEE International Conference on RFID, RFID 2017, Phoenix, AZ, USA, May 9-11, 2017. IEEE 2017, ISBN 978-1-5090-4576-1 [contents]

IEEE RFID 2016: Orlando, FL, USA
- 2016 IEEE International Conference on RFID, RFID 2016, Orlando, FL, USA, May 3-5, 2016. IEEE 2016, ISBN 978-1-4673-8807-8 [contents]

IEEE RFID 2015: San Diego, CA, USA
- 2015 IEEE International Conference on RFID, RFID 2015, San Diego, CA, USA, April 15-17, 2015. IEEE 2015, ISBN 978-1-4799-1937-6 [contents]

IEEE RFID 2014: Orlando, FL, USA
- IEEE International Conference on RFID, IEEE RFID 2014, Orlando, FL, USA, April 8-10, 2014. IEEE 2014, ISBN 978-1-4799-3587-1 [contents]


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