![](https://dblp.dagstuhl.de/img/logo.ua.320x120.png)
![](https://dblp.dagstuhl.de/img/dropdown.dark.16x16.png)
![](https://dblp.dagstuhl.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
![search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
default search action
SwSTE 2010: Herzelia, Israel
- IEEE International Conference on Software Science, Technology & Engineering, SwSTE 2010, Herzlia, Israel, June 15-16, 2010. IEEE Computer Society 2010, ISBN 978-0-7695-4061-0
Modeling and Design
- Uri Shani, Aviad Sela:
Integrating Domain-Specific Programming into Software Design. 1-6 - Moshe Asher Cohen:
Methodology of Discrete System Simulation Modeling with SimWiz. 7-12 - Mayer Goldberg, Guy Wiener:
Round-Trip Modeling Using OPM/PL. 13-21
Algorithms
- Katerina Opocenska, Jakub Yaghob
, Filip Zavoral
:
Dynamic Setup for Clusters with Multi-master Architecture. 22-29 - Ricardo Contreras, Andrea Zisman:
A Pattern-Based Approach for Monitor Adaptation. 30-37 - Rolando Blanco, Paulo S. C. Alencar:
Distributed Event-Based System Features: Representation and Reasoning. 38-46
Methodologies
- Amir Shatil, Orit Hazzan, Yael Dubinsky:
Agility in a Large-Scale System Engineering Project: A Case-Study of an Advanced Communication System Project. 47-54 - Leah Goldin, Michal Matalon-Beck, Judith Lapid-Maoz:
Reuse of Requirements Reduces Time to Market. 55-60 - Hanania T. Salzer:
Abstraction Level Hierarchy: The Model and its Significance for Software Engineering. 61-69
Ethics in Software Engineering
- Daniel M. Berry, Brian Berenbach:
Ethics Test Results Before and After Ethics Training: A Disturbing Experience. 70-76
![](https://dblp.dagstuhl.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.