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ORCID39th VTS 2021: San Diego, CA, USA
- 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021. IEEE 2021, ISBN 978-1-6654-1949-9
- Serge Leef:
Algorithm to Architecture to RTL to GDSII: Incorporating Security into All Phases of SoC Design and Implementation Flow - Keynote. - Karim Arabi:
Edge Computing Trends, Design and Test Challenges - Keynote. - Ishaan Bassi, Sule Ozev, Doohwang Chang:
Maintaining NIST-Traceability for MEMS Sensors via In-Field Electrical Recalibration. 1-7 - Sarvesh Patankar, Sainath Karlapalem, Sakshi Biyani, Wen Chen, Roman Chovanec, Martin Vlk, Martin Kaspar:
Hybrid Methodology for Verification of SW Safety Mechanisms. 1-4 - Om Prakash, Chetan K. Dabhi, Yogesh Singh Chauhan
, Hussam Amrouch:
Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. 1-7 - Chenlei Fang, Qicheng Huang, R. D. Shawn Blanton:
Memory-Efficient Adaptive Test Pattern Reordering for Accurate Diagnosis. 1-7 - Ning-Chi Huang, Wei-Kai Tseng, Huan-Jan Chou, Kai-Chiang Wu:
An Energy-Efficient Approximate Systolic Array Based on Timing Error Prediction and Prevention. 1-7 - Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee:
Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. 1-7 - Elham Amini, Kai Bartels, Christian Boit, Marius Eggert, Norbert Herfurth, Tuba Kiyan, Thilo Krachenfels, Jean-Pierre Seifert, Shahin Tajik:
Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities. 1-12 - Anurag Tulsiram, William R. Eisenstadt:
Design for Testability of Low Dropout Regulators. 1-7 - Srikanth Beerla, Miguel Costa:
Enabling ECC and Repair Features in an eFuse Box for Memory Repair Applications. 1-4 - Natalia Lylina, Ahmed Atteya, Hans-Joachim Wunderlich:
A Hybrid Protection Scheme for Reconfigurable Scan Networks. 1-7 - Renjian Pan, Xin Li, Krishnendu Chakrabarty:
Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems. 1-6 - Sohrab Aftabjahani, Ryan Kastner, Mark M. Tehranipoor, Farimah Farahmandi, Jason Oberg, Anders Nordstrom, Nicole Fern, Alric Althoff:
Special Session: CAD for Hardware Security - Automation is Key to Adoption of Solutions. 1-10 - V. A. Niranjan, Deepika Neethirajan, Constantinos Xanthopoulos, E. De La Rosa, C. Alleyne, S. Mier, Yiorgos Makris:
Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation. 1-7 - Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil:
Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. 1-6 - Jinhua Zhu, Zhen Gao, Jie Jin, Pedro Reviriego:
Reliability Evaluation of the Count Min Sketch (CMS) against Single Event Transients (SETs). 1-6 - Simon Thomann, Chao Li, Cheng Zhuo, Om Prakash, Xunzhao Yin, Xiaobo Sharon Hu, Hussam Amrouch:
On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. 1-6 - Nusrat Farzana, Avinash Ayalasomayajula, Fahim Rahman, Farimah Farahmandi, Mark M. Tehranipoor:
SAIF: Automated Asset Identification for Security Verification at the Register Transfer Level. 1-7 - Nikolaos Ioannis Deligiannis, Riccardo Cantoro, Matthias Sauer, Bernd Becker, Matteo Sonza Reorda:
New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core. 1-7 - Irith Pomeranz:
Compact Set of LFSR Seeds for Diagnostic Tests. 1-7 - Emmanuel Casseau, Petr Dobiás, Oliver Sinnen, Gennaro Severino Rodrigues, Fernanda Lima Kastensmidt, Alessandro Savino, Stefano Di Carlo, Maurizio Rebaudengo, Alberto Bosio:
Special Session: Operating Systems under test: an overview of the significance of the operating system in the resiliency of the computing continuum. 1-10 - Stephen Sunter, Krzysztof Jurga:
Automated Observability Analysis for Mixed-Signal Circuits. 1-6 - Josie E. Rodriguez Condia, Fernando Fernandes dos Santos, Matteo Sonza Reorda, Paolo Rech:
Combining Architectural Simulation and Software Fault Injection for a Fast and Accurate CNNs Reliability Evaluation on GPUs. 1-7 - Siddhanth Dhodhi, Debarshi Chatterjee, Eric Hill, Saad Godil:
Deep Stalling using a Coverage Driven Genetic Algorithm Framework. 1-4 - Sebastian Brandhofer, Simon J. Devitt, Thomas Wellens, Ilia Polian:
Special Session: Noisy Intermediate-Scale Quantum (NISQ) Computers - How They Work, How They Fail, How to Test Them? 1-10 - Wei Li, Shih-Yu Yang, Khen Wee, Ricardo Sanchez, Jay Desai, Kun-Han Tsai, Xijiang Lin:
Timing Critical Path Validation for Intel ATOM Cores Using Structural Test. 1-6 - Shamik Kundu, Kanad Basu, Mehdi Sadi, Twisha Titirsha, Shihao Song, Anup Das, Ujjwal Guin:
Special Session: Reliability Analysis for AI/ML Hardware. 1-10 - Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. 1-14 - Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan:
Special Session: Machine Learning for Semiconductor Test and Reliability. 1-11 - Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch:
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. 1-7 - Ziqi Zhou, Ujjwal Guin, Peng Li, Vishwani D. Agrawal:
Defect Characterization and Testing of Skyrmion-Based Logic Circuits. 1-7 - Cheng-Hao Yang, Chia-Heng Yen, Ting-Rui Wang, Chun-Teng Chen, Mason Chern, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao:
Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks. 1-7 - Junchi Ma, Zongtao Duan, Lei Tang:
GATPS: An attention-based graph neural network for predicting SDC-causing instructions. 1-7 - Huawei Li, Xiaowei Li, Yu Huang, Ying Wang, Gary Guo:
Special Session - Test for AI Chips: from DFT to On-line Testing. 1 - Kangkang Xu, Yang Yu, Xiyuan Peng:
TSV Fault Modeling and A BIST Solution for TSV Pre-bond Test. 1-6 - Xingyi Wang, Yu Li, Yiquan Chen, Shiwen Wang, Yin Du, Cheng He, Yuzhong Zhang, Pinan Chen, Xin Li, Wenjun Song, Qiang Xu, Li Jiang:
On Workload-Aware DRAM Failure Prediction in Large-Scale Data Centers. 1-6
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