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Computers in Industry, Volume 66

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Volume 66, January 2015

Review Paper

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Szu-Hao Huang, Ying-Cheng Pan:
Automated visual inspection in the semiconductor industry: A survey. 1-10

Papers

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  - journals/cii/MonticoloBGBC15
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Davy Monticolo, Julien Badin, Samuel Gomes, Eric Bonjour, Dominique Chamoret:
A meta-model for knowledge configuration management to support collaborative engineering. 11-20
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  - journals/cii/SegondsMNG15
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Frédéric Segonds, Fabrice Mantelet, Julien Nelson, Stéphane Gaillard:
Proposition of a PLM tool to support textile design: A case study applied to the definition of the early stages of design requirements. 21-30
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  - journals/cii/Silvestre-BlanesBSF15
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Javier Silvestre-Blanes, Joaquin Berenguer-Sebastiá, Víctor-M. Sempere-Payá, David Todolí Ferrandis:
802.11n Performance analysis for a real multimedia industrial application. 31-40
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Jie Hu, Jin Qi, Ying-hong Peng:
New CBR adaptation method combining with problem-solution relational analysis for mechanical design. 41-51
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Namchul Do, Sungmoon Bae, Chulsoon Park:
Interactive analysis of product development experiments using On-line Analytical Mining. 52-62
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  - journals/cii/FoxGKST15
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John Fox, Marc Gutenstein, Omar Khan, Matthew South, Richard Thomson:
OpenClinical.net: A platform for creating and sharing knowledge and promoting best practice in healthcare. 63-72
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Santiago Arroyave-Tobón, Gilberto Osorio-Gómez, Juan F. Cardona-McCormick:
AIR-MODELLING: A tool for gesture-based solid modelling in context during early design stages in AR environments. 73-81
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  - journals/cii/KublerFD15
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Sylvain Kubler, Kary Främling, William Derigent:
P2P Data synchronization for product lifecycle management. 82-98
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  - journals/cii/BarbosaLAT15
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José Barbosa, Paulo Leitão, Emmanuel Adam, Damien Trentesaux:
Dynamic self-organization in holonic multi-agent manufacturing systems: The ADACOR evolution. 99-111

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