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Journal of Electronic Testing, Volume 40
Volume 40, Number 1, February 2024
- Vishwani D. Agrawal:
Editorial. 1-2 - 2023 JETTA Reviewers. 3-4
- Yuling Shang, Songyi Wei, Chunquan Li, Xiaojing Ye, Lizhen Zeng, Wei Hu, Xiang He, Jinzhuo Zhou:
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis. 5-18 - Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan:
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. 19-30 - Shun-Hua Yang, Shi-Yu Huang:
General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting Scheme. 31-43 - Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang:
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches. 45-60 - M. N. Saranya, Rathnamala Rao:
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems. 61-74 - Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. 75-86 - Chen Dong, Xiao Chen, Zhenyi Chen:
Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees. 87-99 - Linsen Huang:
Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration. 101-106 - Shifeng Yu, Junjie Dai, Junhui Li:
Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration. 107-116 - Hala Ibrahim, Haytham Azmi, M. Watheq El-Kharashi, Mona Safar:
Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach. 117-135
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