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Pattern Recognition, Volume 6
Volume 6, Number 1, June 1974
- Louis-François Pau:
Applications of pattern recognition to the diagnosis of equipment failures. 3-11 - J. P. Basu, Patrick L. Odell:
Effect of intraclass correlation among training samples on the misclassification probabilities of bayes procedure. 13-16 - Edwin Diday:
Optimization in non-hierarchical clustering. 17-33 - Lee J. White, A. Art Ksienski:
Aircraft identification using a bilinear surface representation of radar data. 35-45 - E. T. Lee:
The shape-oriented dissimilarity of polygons and its application to the classification of chromosome images. 47-60 - Michael L. Baird, Michael D. Kelly:
A paradigm for semantic picture recognition. 61-74
Volume 6, Number 2, October 1974
- Nebojsa S. Ivancevic:
Stereometric pattern recognition by artificial touch. 77-83 - Paul J. Nahin:
The theory and measurement of a silhouette descriptor for image pre-processing and recognition. 85-95 - William L. Brogan, Allen R. Edison:
Automatic classification of grains via pattern recognition techniques. 97-103 - Frederick Hayes-Roth:
Schematic classification problems and their solution. 105-113 - Gösta H. Granlund:
Statistical analysis of chromosome characteristics. 115-126 - Julian R. Ullmann:
Binarization using associative addressing. 127-135
Volume 6, Number 3-4, December 1974
- W. R. Throssell, P. R. Fryer:
The measurement of print quality for optical character recognition systems. 141-147 - Douglas J. H. Moore, David J. Parker:
Analysis of global pattern features. 149-164 - Paulien Hogeweg, Ben Hesper:
A model study on biomorphological description. 165-179 - James R. Slagle, Chin-Liang Chang, Richard C. T. Lee:
Experiments with some cluster analysis algorithms. 181-187 - James Gips:
A syntax-directed program that performs a three-dimensional perceptual task. 189-199
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