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Quality and Reliability Engineering International, Volume 23
Volume 23, Number 1, February 2007
- Loon Ching Tang, Thong Ngee Goh, Shao-Wei Lam, Cai Wen Zhang:
Fortification of Six Sigma: expanding the DMAIC toolset. 3-18 - Yuan Lu
, Elke den Ouden
, Aarnout Brombacher, Wim Geudens, Herman Hartmann:
Towards a more systematic analysis of uncertain user-product interactions in product development: an enhanced user-product interaction framework. 19-29 - Kwang-Jae Kim, Deok-Hwan Kim, Dae-Kee Min:
Robust QFD: framework and a case study. 31-44 - Xin Lai, Kay-Chuan Tan, Min Xie
:
Optimizing product design using quantitative quality function deployment: a case study. 45-57 - David Joaquin Delgado Hernandez, Elaine Aspinwall:
Improvement methods in U.K. and Mexican construction industries: a comparison. 59-70 - Susan S. Lu, Yu-Chen Tu, Huitian Lu:
Predictive condition-based maintenance for continuously deteriorating systems. 71-81 - R. Jiang, Andrew K. S. Jardine:
An optimal burn-in preventive-replacement model associated with a mixture distribution. 83-93 - W. Wang, X. Jia:
An empirical Bayesian based approach to delay time inspection model parameters estimation using both subjective and objective data. 95-105 - Jih-An Chen, Yu-Hung Chien:
Renewing warranty and preventive maintenance for products with failure penalty post-warranty. 107-121 - J. Wesley Hines, Dustin Garvey:
Process and equipment monitoring methodologies applied to sensor calibration monitoring. 123-135 - Tim Leung, Tom Carroll, May Hung, Albert Tsang, Walter Chung:
The Carroll-Hung method for component reliability mapping in aircraft maintenance. 137-154
Volume 23, Number 2, March 2007
- Aarnout Brombacher:
Where is research on quality and reliability going? 155
- Zhang Wu, Sheng Zhang, Penghui Wang:
A CUSUM scheme with variable sample sizes and sampling intervals for monitoring the process mean and variance. 157-170 - Young Kap Son, Gordon J. Savage:
Set theoretic formulation of performance reliability of multiple response time-variant systems due to degradations in system components. 171-188 - Spencer Graves, Søren Bisgaard, Murat Kulahci
, John Van Gilder, John James, Ken Marko, Hal Zatorski, Tom Ting, Cuiping Wu:
Accelerated testing of on-board diagnostics. 189-201 - Ling Yang, Shey-Huei Sheu:
Economic design of the integrated multivariate EPC and multivariate SPC charts. 203-218 - Harriet Black Nembhard, Pannapa Changpetch:
Directed monitoring using Cuscore charts for seasonal time series. 219-232 - Yiannis Nikolaidis, George Rigas, George Tagaras:
Using economically designed Shewhart and adaptive ―X charts for monitoring the quality of tiles. 233-245 - Mahmoud A. Mahmoud
, Peter A. Parker, William H. Woodall, Douglas M. Hawkins:
A change point method for linear profile data. 247-268
- Lie-Fern Hsu:
Note on 'Construction of Double Sampling s-Control Charts for Agile Manufacturing'. 269-272 - Saralees Nadarajah, Samuel Kotz:
Programs in R for computing truncated t distributions. 273-278
- Saralees Nadarajah, Samuel Kotz:
The two-parameter bathtub-shaped lifetime distribution. 279-280
- Saralees Nadarajah, Samuel Kotz:
The two-parameter bathtub-shaped lifetime distribution. iii
Volume 23, Number 3, April 2007
- Douglas C. Montgomery:
Strengthening Six Sigma. 281-282
- Murat Kulahci
:
Blocking Two-level Factorial Experiments. 283-289 - Shaul P. Ladany, Haim Shore
:
Profit Maximizing Warranty Period with Sales Expressed by a Demand Function. 291-301 - Harriet Black Nembhard, René Valverde-Ventura:
Cuscore Statistics to Monitor a Non-stationary System. 303-325 - Marcus B. Perry, Joseph J. Pignatiello Jr., James R. Simpson:
Estimating the Change Point of the Process Fraction Non-conforming with a Monotonic Change Disturbance in SPC. 327-339 - Deborah K. Shepherd, Charles W. Champ, Steven E. Rigdon, Howard T. Fuller:
Attribute Charts for Monitoring a Dependent Process. 341-365 - Ruey-Shiang Guh:
On-line Identification and Quantification of Mean Shifts in Bivariate Processes using a Neural Network-based Approach. 367-385 - Jagmeet Singh, Daniel D. Frey, Nathan Soderborg, Rajesh Jugulum:
Compound Noise: Evaluation as a Robust Design Method. 387-398
Volume 23, Number 4, June 2007
- Aarnout Brombacher:
Product Innovation, Product Reliability and 'An Inconvenient Truth'. 399
- Roxana A. Ion, Valia T. Petkova, Bas H. J. Peeters, Peter C. Sander:
Field Reliability Prediction in Consumer Electronics Using Warranty Data. 401-414 - Olli Salmela, Klas Andersson, Altti Perttula, Jussi Särkkä, Markku Tammenmaa:
Re-calibration of Engelmaier's Model for Leadless, Lead-free Solder Attachments. 415-429 - Peng Zhang, Jinji Gao:
Reliability Analysis of a Novel Pulse Code Modulation Flow Control Valve with Self-compensating Ability. 431-444 - Sinan Salman
, C. Richard Cassady, Edward A. Pohl, Stephen W. Ormon:
Evaluating the impact of cannibalization on fleet performance. 445-457 - Min Xie
, Qingpei Hu
, Y. P. Wu, Szu Hui Ng:
A study of the modeling and analysis of software fault-detection and fault-correction processes. 459-470 - Thomas Mathew, George Sebastian, K. M. Kurian:
Generalized confidence intervals for process capability indices. 471-481 - Harriet Black Nembhard, Shuohui Chen:
Cuscore control charts for generalized feedback-control systems. 483-502 - Rex Lam, Jan K. Spelt:
Comparison of Weibull small samples using Monte Carlo simulations. 503-513
Volume 23, Number 5, August 2007
- Douglas C. Montgomery:
SPC research - Current trends. 515-516
- Sotiris Bersimis, Stelios Psarakis, John Panaretos:
Multivariate statistical process control charts: an overview. 517-543 - Nong Ye, Qiang Chen:
Attack-norm separation for detecting attack-induced quality problems on computers and networks. 545-553 - Leonard A. Perry, Douglas C. Montgomery, John W. Fowler
:
A partition experimental design for a sequential process with a large number of variables. 555-564 - Stefano Barone, Paolo D'Ambrosio, Pasquale Erto
:
A statistical monitoring approach for automotive on-board diagnostic systems. 565-575 - Li Liang, Christine M. Anderson-Cook, Timothy J. Robinson:
Cost-penalized estimation and prediction evaluation for split-plot designs. 577-596 - Bi-Min Hsu, Ming-Hung Shu, Wen Lea Pearn:
Measuring process capability based on Cpmk with gauge measurement errors. 597-614 - Willis A. Jensen, Jeffrey B. Birch, William H. Woodall:
High breakdown estimation methods for Phase I multivariate control charts. 615-629
- Shuen-Tai Ung, Stephen Bonsall, Vincent Williams, Alan D. Wall, Jin Wang:
The application of the Six Sigma concept to port security process quality control. 631-639
Volume 23, Number 6, October 2007
- John Tyssedal:
Industrial Statistics: Quality management, application and development. 641 - Gerald J. Hahn:
The business and industrial statistician: Past, present and future. 643-650 - Ron S. Kenett
, Øystein Evandt:
Interview with Dr J.M.Juran on the occasion of the International Quality Conference in Jerusalem on 8 November 1994. 651-652 - A. Blanton Godfrey
, Ron S. Kenett
:
Joseph M. Juran, a perspective on past contributions and future impact. 653-663 - Søren Bisgaard:
Quality management and Juran's legacy. 665-677 - Frøydis Bjerke, Hanne Larsen
, Siri Geiner Tellefsen:
Analysing multivariate data from designed experiments: a case study of photo-oxidation in sour cream. 679-688 - Stefano Barone, Alberto Lombardo
, Pietro Tarantino:
A weighted logistic regression for conjoint analysis and Kansei engineering. 689-706 - Bianca Maria Colosimo
, Massimo Pacella
:
On the use of principal component analysis to identify systematic patterns in roundness profiles. 707-725 - Malgorzata Bogdan, Jayanta K. Ghosh, Aleksandra Ochman, Surya T. Tokdar:
On the Empirical Bayes approach to the problem of multiple testing. 727-739 - Christian H. Weiß:
Controlling correlated processes of Poisson counts. 741-754 - Kerstin Vännman, Malin Albing:
Process capability indices for one-sided specification intervals and skewed distributions. 755-765
- John Tyssedal:
Erratum: Industrial Statistics: Quality Management, Application and Development.
Volume 23, Number 7, November 2007
- Aarnout Brombacher:
Dependability . . . 767
- Philippe Castagliola, Kerstin Vännman:
Monitoring capability indices using an EWMA approach. 769-790 - Murat Kulahci
, Søren Bisgaard:
Partial confounding and projective properties of Plackett-Burman designs. 791-800 - Tormod Næs, Are Halvor Aastveit, Narinder Singh Sahni:
Analysis of split-plot designs: an overview and comparison of methods. 801-820 - Antonio Fernando Branco Costa, Maysa S. De Magalhães:
An adaptive chart for monitoring the process mean and variance. 821-831 - Subhash Chandra Panja, Pradip Kumar Ray
:
Reliability analysis of a 'point-and-point machine' of the Indian railway signaling system. 833-848
- Maneesh Kumar
, Jiju Antony, Frenie Jiju Antony, Christian N. Madu:
Winning customer loyalty in an automotive company through Six Sigma: a case study. 849-866 - Suprakash Gupta, Jayanta Bhattacharya:
Reliability Analysis of a conveyor system using hybrid data. 867-882
Volume 23, Number 8, December 2007
- Aarnout Brombacher:
Globalization and product reliability; What to do... 883
- Elias P. Zafiropoulos, Evangelos N. Dialynas:
Methodology for the optimal component selection of electronic devices under reliability and cost constraints. 885-897 - Gonen Singer
, Irad Ben-Gal:
The funnel experiment: The Markov-based SPC approach. 899-913 - Evans Gouno:
Optimum step-stress for temperature accelerated life testing. 915-924 - James D. Williams, William H. Woodall, Jeffrey B. Birch:
Statistical monitoring of nonlinear product and process quality profiles. 925-941 - Diederik Lugtigheid, Andrew K. S. Jardine, Xiaoyue Jiang:
Optimizing the performance of a repairable system under a maintenance and repair contract. 943-960
- Olli Salmela:
Application of the Mixed-field-environments concept in lifetime prediction of some ceramic components. 961-971
- Rajiv Kumar Sharma, Dinesh Kumar, Pradeep Kumar:
Modeling system behavior for risk and reliability analysis using KBARM. 973-998
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