Quality and Reliability Engineering International, Volume 23

Volume 23, Number 1, February 2007

Fourth International Conference on Quality and Reliability (ICQR2005) Editorials

• 
  Yuan Lu, Min Xie:
  Fourth International Conference on Quality and Reliability (ICQR2005). 1

Research Articles

• 
  Loon Ching Tang, Thong Ngee Goh, Shao-Wei Lam, Cai Wen Zhang:
  Fortification of Six Sigma: expanding the DMAIC toolset. 3-18
• 
  Yuan Lu, Elke den Ouden, Aarnout Brombacher, Wim Geudens, Herman Hartmann:
  Towards a more systematic analysis of uncertain user-product interactions in product development: an enhanced user-product interaction framework. 19-29
• 
  Kwang-Jae Kim, Deok-Hwan Kim, Dae-Kee Min:
  Robust QFD: framework and a case study. 31-44
• 
  Xin Lai, Kay-Chuan Tan, Min Xie:
  Optimizing product design using quantitative quality function deployment: a case study. 45-57
• 
  David Joaquin Delgado Hernandez, Elaine Aspinwall:
  Improvement methods in U.K. and Mexican construction industries: a comparison. 59-70
• 
  Susan S. Lu, Yu-Chen Tu, Huitian Lu:
  Predictive condition-based maintenance for continuously deteriorating systems. 71-81
• 
  R. Jiang, Andrew K. S. Jardine:
  An optimal burn-in preventive-replacement model associated with a mixture distribution. 83-93
• 
  W. Wang, X. Jia:
  An empirical Bayesian based approach to delay time inspection model parameters estimation using both subjective and objective data. 95-105
• 
  Jih-An Chen, Yu-Hung Chien:
  Renewing warranty and preventive maintenance for products with failure penalty post-warranty. 107-121
• 
  J. Wesley Hines, Dustin Garvey:
  Process and equipment monitoring methodologies applied to sensor calibration monitoring. 123-135
• 
  Tim Leung, Tom Carroll, May Hung, Albert Tsang, Walter Chung:
  The Carroll-Hung method for component reliability mapping in aircraft maintenance. 137-154

Volume 23, Number 2, March 2007

Editorials

• 
  Aarnout Brombacher:
  Where is research on quality and reliability going? 155

Research Articles

• 
  Zhang Wu, Sheng Zhang, Penghui Wang:
  A CUSUM scheme with variable sample sizes and sampling intervals for monitoring the process mean and variance. 157-170
• 
  Young Kap Son, Gordon J. Savage:
  Set theoretic formulation of performance reliability of multiple response time-variant systems due to degradations in system components. 171-188
• 
  Spencer Graves, Søren Bisgaard, Murat Kulahci, John Van Gilder, John James, Ken Marko, Hal Zatorski, Tom Ting, Cuiping Wu:
  Accelerated testing of on-board diagnostics. 189-201
• 
  Ling Yang, Shey-Huei Sheu:
  Economic design of the integrated multivariate EPC and multivariate SPC charts. 203-218
• 
  Harriet Black Nembhard, Pannapa Changpetch:
  Directed monitoring using Cuscore charts for seasonal time series. 219-232
• 
  Yiannis Nikolaidis, George Rigas, George Tagaras:
  Using economically designed Shewhart and adaptive ―X charts for monitoring the quality of tiles. 233-245
• 
  Mahmoud A. Mahmoud, Peter A. Parker, William H. Woodall, Douglas M. Hawkins:
  A change point method for linear profile data. 247-268

Short Communications

• 
  Lie-Fern Hsu:
  Note on 'Construction of Double Sampling s-Control Charts for Agile Manufacturing'. 269-272
• 
  Saralees Nadarajah, Samuel Kotz:
  Programs in R for computing truncated t distributions. 273-278

Letters to the Editor

• 
  Saralees Nadarajah, Samuel Kotz:
  The two-parameter bathtub-shaped lifetime distribution. 279-280

Errata

• 
  Saralees Nadarajah, Samuel Kotz:
  The two-parameter bathtub-shaped lifetime distribution. iii

Volume 23, Number 3, April 2007

Editorials

• 
  Douglas C. Montgomery:
  Strengthening Six Sigma. 281-282

Research Articles

• 
  Murat Kulahci:
  Blocking Two-level Factorial Experiments. 283-289
• 
  Shaul P. Ladany, Haim Shore:
  Profit Maximizing Warranty Period with Sales Expressed by a Demand Function. 291-301
• 
  Harriet Black Nembhard, René Valverde-Ventura:
  Cuscore Statistics to Monitor a Non-stationary System. 303-325
• 
  Marcus B. Perry, Joseph J. Pignatiello Jr., James R. Simpson:
  Estimating the Change Point of the Process Fraction Non-conforming with a Monotonic Change Disturbance in SPC. 327-339
• 
  Deborah K. Shepherd, Charles W. Champ, Steven E. Rigdon, Howard T. Fuller:
  Attribute Charts for Monitoring a Dependent Process. 341-365
• 
  Ruey-Shiang Guh:
  On-line Identification and Quantification of Mean Shifts in Bivariate Processes using a Neural Network-based Approach. 367-385
• 
  Jagmeet Singh, Daniel D. Frey, Nathan Soderborg, Rajesh Jugulum:
  Compound Noise: Evaluation as a Robust Design Method. 387-398

Volume 23, Number 4, June 2007

Editorials

• 
  Aarnout Brombacher:
  Product Innovation, Product Reliability and 'An Inconvenient Truth'. 399

Research Articles

• 
  Roxana A. Ion, Valia T. Petkova, Bas H. J. Peeters, Peter C. Sander:
  Field Reliability Prediction in Consumer Electronics Using Warranty Data. 401-414
• 
  Olli Salmela, Klas Andersson, Altti Perttula, Jussi Särkkä, Markku Tammenmaa:
  Re-calibration of Engelmaier's Model for Leadless, Lead-free Solder Attachments. 415-429
• 
  Peng Zhang, Jinji Gao:
  Reliability Analysis of a Novel Pulse Code Modulation Flow Control Valve with Self-compensating Ability. 431-444
• 
  Sinan Salman, C. Richard Cassady, Edward A. Pohl, Stephen W. Ormon:
  Evaluating the impact of cannibalization on fleet performance. 445-457
• 
  Min Xie, Qingpei Hu, Y. P. Wu, Szu Hui Ng:
  A study of the modeling and analysis of software fault-detection and fault-correction processes. 459-470
• 
  Thomas Mathew, George Sebastian, K. M. Kurian:
  Generalized confidence intervals for process capability indices. 471-481
• 
  Harriet Black Nembhard, Shuohui Chen:
  Cuscore control charts for generalized feedback-control systems. 483-502
• 
  Rex Lam, Jan K. Spelt:
  Comparison of Weibull small samples using Monte Carlo simulations. 503-513

Volume 23, Number 5, August 2007

Editorials

• 
  Douglas C. Montgomery:
  SPC research - Current trends. 515-516

Research Articles

• 
  Sotiris Bersimis, Stelios Psarakis, John Panaretos:
  Multivariate statistical process control charts: an overview. 517-543
• 
  Nong Ye, Qiang Chen:
  Attack-norm separation for detecting attack-induced quality problems on computers and networks. 545-553
• 
  Leonard A. Perry, Douglas C. Montgomery, John W. Fowler:
  A partition experimental design for a sequential process with a large number of variables. 555-564
• 
  Stefano Barone, Paolo D'Ambrosio, Pasquale Erto:
  A statistical monitoring approach for automotive on-board diagnostic systems. 565-575
• 
  Li Liang, Christine M. Anderson-Cook, Timothy J. Robinson:
  Cost-penalized estimation and prediction evaluation for split-plot designs. 577-596
• 
  Bi-Min Hsu, Ming-Hung Shu, Wen Lea Pearn:
  Measuring process capability based on C_pmk with gauge measurement errors. 597-614
• 
  Willis A. Jensen, Jeffrey B. Birch, William H. Woodall:
  High breakdown estimation methods for Phase I multivariate control charts. 615-629

Application Articles

• 
  Shuen-Tai Ung, Stephen Bonsall, Vincent Williams, Alan D. Wall, Jin Wang:
  The application of the Six Sigma concept to port security process quality control. 631-639

Volume 23, Number 6, October 2007

Industrial Statistics: Quality management, Application and Development Special Issue Articles

• 
  John Tyssedal:
  Industrial Statistics: Quality management, application and development. 641
• 
  Gerald J. Hahn:
  The business and industrial statistician: Past, present and future. 643-650
• 
  Ron S. Kenett, Øystein Evandt:
  Interview with Dr J.M.Juran on the occasion of the International Quality Conference in Jerusalem on 8 November 1994. 651-652
• 
  A. Blanton Godfrey, Ron S. Kenett:
  Joseph M. Juran, a perspective on past contributions and future impact. 653-663
• 
  Søren Bisgaard:
  Quality management and Juran's legacy. 665-677
• 
  Frøydis Bjerke, Hanne Larsen, Siri Geiner Tellefsen:
  Analysing multivariate data from designed experiments: a case study of photo-oxidation in sour cream. 679-688
• 
  Stefano Barone, Alberto Lombardo, Pietro Tarantino:
  A weighted logistic regression for conjoint analysis and Kansei engineering. 689-706
• 
  Bianca Maria Colosimo, Massimo Pacella:
  On the use of principal component analysis to identify systematic patterns in roundness profiles. 707-725
• 
  Malgorzata Bogdan, Jayanta K. Ghosh, Aleksandra Ochman, Surya T. Tokdar:
  On the Empirical Bayes approach to the problem of multiple testing. 727-739
• 
  Christian H. Weiß:
  Controlling correlated processes of Poisson counts. 741-754
• 
  Kerstin Vännman, Malin Albing:
  Process capability indices for one-sided specification intervals and skewed distributions. 755-765

Errata

• 
  John Tyssedal:
  Erratum: Industrial Statistics: Quality Management, Application and Development.

Volume 23, Number 7, November 2007

Editorials

• 
  Aarnout Brombacher:
  Dependability . . . 767

Research Articles

• 
  Philippe Castagliola, Kerstin Vännman:
  Monitoring capability indices using an EWMA approach. 769-790
• 
  Murat Kulahci, Søren Bisgaard:
  Partial confounding and projective properties of Plackett-Burman designs. 791-800
• 
  Tormod Næs, Are Halvor Aastveit, Narinder Singh Sahni:
  Analysis of split-plot designs: an overview and comparison of methods. 801-820
• 
  Antonio Fernando Branco Costa, Maysa S. De Magalhães:
  An adaptive chart for monitoring the process mean and variance. 821-831
• 
  Subhash Chandra Panja, Pradip Kumar Ray:
  Reliability analysis of a 'point-and-point machine' of the Indian railway signaling system. 833-848

Case Studies

• 
  Maneesh Kumar, Jiju Antony, Frenie Jiju Antony, Christian N. Madu:
  Winning customer loyalty in an automotive company through Six Sigma: a case study. 849-866
• 
  Suprakash Gupta, Jayanta Bhattacharya:
  Reliability Analysis of a conveyor system using hybrid data. 867-882

Volume 23, Number 8, December 2007

Editorials

• 
  Aarnout Brombacher:
  Globalization and product reliability; What to do... 883

Research Articles

• 
  Elias P. Zafiropoulos, Evangelos N. Dialynas:
  Methodology for the optimal component selection of electronic devices under reliability and cost constraints. 885-897
• 
  Gonen Singer, Irad Ben-Gal:
  The funnel experiment: The Markov-based SPC approach. 899-913
• 
  Evans Gouno:
  Optimum step-stress for temperature accelerated life testing. 915-924
• 
  James D. Williams, William H. Woodall, Jeffrey B. Birch:
  Statistical monitoring of nonlinear product and process quality profiles. 925-941
• 
  Diederik Lugtigheid, Andrew K. S. Jardine, Xiaoyue Jiang:
  Optimizing the performance of a repairable system under a maintenance and repair contract. 943-960

Application Articles

• 
  Olli Salmela:
  Application of the Mixed-field-environments concept in lifetime prediction of some ceramic components. 961-971

Case Studies

• 
  Rajiv Kumar Sharma, Dinesh Kumar, Pradeep Kumar:
  Modeling system behavior for risk and reliability analysis using KBARM. 973-998