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Software Quality Journal, Volume 10
Volume 10, Number 1, July 2002
- James M. Bieman:

In This Issue. 5-6 - James M. Bieman:

Editorial: Risks to Software Quality. 7-9 - John Moses, Malcolm Farrow, Peter Smith:

Statistical Methods for Predicting and Improving Cohesion Using Information Flow: An Empirical Study. 11-46 - William G. Tuohey:

Benefits and Effective Application of Software Engineering Standards. 47-68 - Houman Younessi, Panlop Zeephongsekul, Winai Bodhisuwan

:
A General Model of Unit Testing Efficacy. 69-92
Volume 10, Number 2, September 2002
- Margaret Ross:

In This Issue. 99-100 - Ita Richardson

:
SPI Models: What Characteristics are Required for Small Software Development Companies? 101-114 - Jonathan Vincent, Graham King, Peter Lay, John Kinghorn:

Principles of Built-In-Test for Run-Time-Testability in Component-Based Software Systems. 115-133 - John Moses:

Measuring Effort Estimation Uncertainty to Improve Client Confidence. 135-148 - Boris I. Cogan, Elena A. Shalfeeva

:
A Generalized Structural Model of Structured Programs for Software Metrics Definition. 149-167 - Kerstin V. Siakas, Elli Georgiadou:

Empirical Measurement of the Effects of Cultural Diversity on Software Quality Management. 169-180 - Mercedes Ruiz

, Isabel Ramos
, Miguel Toro
:
A Dynamic Integrated Framework for Software Process Improvement. 181-194
Volume 10, Number 3, November 2002
- James M. Bieman:

In This Issue. 199-200 - James M. Bieman:

Editorial: Why Good Software Goes Bad. 201-203 - Jessica Chen, Suganthan Subramaniam:

Specification-based Testing for Gui-based Applications. 205-224 - Anneliese Amschler Andrews, Chunhui Zhu, Michael Scheetz, Eric Dahlman, Adele E. Howe:

AI Planner Assisted Test Generation. 225-259 - José Antonio Calvo-Manzano Villalón

, Gonzalo Cuevas Agustín, Tomás San Feliu Gilabert, Antonio de Amescua Seco
, Luis García Sánchez, Manuel Pérez Cota:
Experiences in the Application of Software Process Improvement in SMES. 261-273
Volume 10, Number 4, December 2002
- James M. Bieman:

In This Issue. 279-280 - Margaret Ross:

Editorial: The Y2K Legacy-The Time Bomb of Tomorrow. 281-283 - Margaret Ross:

Quality in Web Design for Visually Impaired Users. 285-298 - Catherine Stringfellow, Anneliese Amschler Andrews:

Deriving a Fault Architecture to Guide Testing. 299-330 - Zuhoor A. Al-Khanjari, Martin R. Woodward, Haider Ali Ramadhan:

Critical Analysis of the PIE Testability Technique. 331-354 - Alexander Chatzigeorgiou, George Stephanides:

Energy Metric for Software Systems. 355-371

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