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ORCIDTechnometrics, Volume 45
Volume 45, Number 1, 2003
- William H. Woodall, Rachelle Koudelik, Kwok-Leung Tsui, Seoung Bum Kim, Zachary G. Stoumbos, Christos P. Carvounis:
A Review and Analysis of the Mahalanobis - Taguchi System. 1-15
- Rajesh Jugulum, Genichi Taguchi, Shin Taguchi, James O. Wilkins:
Discussion. 16-21 - Bovas Abraham, Asokan Mulayath Variyath:
Discussion. 22-24 - Douglas M. Hawkins:
Discussion. 25-29
- William H. Woodall, Rachelle Koudelik, Kwok-Leung Tsui, Seoung Bum Kim, Zachary G. Stoumbos, Christos P. Carvounis:
Response. 29-30
- Bo Henry Lindqvist, Georg Elvebakk, Knut Heggland:
The Trend-Renewal Process for Statistical Analysis of Repairable Systems. 31-44
- F. R. Anscombe:
Letter to the Editor. 45-46
- Francis G. Pascual, Grace Montepiedra:
Model-Robust Test Plans With Applications in Accelerated Life Testing. 47-57 - Jason R. W. Merrick
, Refik Soyer, Thomas A. Mazzuchi:
A Bayesian Semiparametric Analysis of the Reliability and Maintenance of Machine Tools. 58-69 - J. T. Gene Hwang, Dan Nettleton:
Principal Components Regression With Data Chosen Components and Related Methods. 70-79 - Derek Bingham, Randy R. Sitter:
Fractional Factorial Split-Plot Designs for Robust Parameter Experiments. 80-89 - Theodore T. Allen, Mikhail Bernshteyn:
Supersaturated Designs That Maximize the Probability of Identifying Active Factors. 90-97
- Mark Von Tress:
Generalized, Linear, and Mixed Models. 99 - James R. Kenyon:
Statistical Methods for the Analysis of Repeated Measurements. 99-100 - Tena Ipsilantis Katsaounis:
Methods of Multivariate Statistics. 100-101 - Henry W. Altland:
Applied Functional Data Analysis. 101-102 - B. D. McCullough:
Predictions in Time Series Using Regression Models. 102 - Dean V. Neubauer:
Statistical Process Adjustment for Quality Control. 102-103 - Karen Kafadar:
Statistical Process Control: The Deming Paradigm and Beyond. 103-104 - Julia C. O'Neill:
Box on Quality and Discovery With Design, Control, and Robustness. 105 - Doris A. Weisman:
Experimental Design With Applications in Management, Engineering and the Sciences. 105 - Ming-Hui Chen:
A Contingency Table Approach to Nonparametric Testing. 105-106 - Pradipta Sarkar:
Sequential Monte Carlo Methods in Practice. 106 - Victor R. Prybutok:
Statistical Rules of Thumb. 107 - John I. McCool:
Probability and Statistics With Reliability, Queuing and Computer Science Applications. 107 - William S. Rayens:
Independent Component Analysis: Principles and Practice. 107-108 - Snehalata V. Huzurbazar:
Statistics of the Galaxy Distribution. 108-109
Volume 45, Number 2, 2003
- William D. Heavlin:
Designing Experiments for Causal Networks. 115-129 - Francis G. Pascual:
Theory for Optimal Test Plans for the Random Fatigue-Limit Model. 130-141 - William Li, Dennis K. J. Lin:
Optimal Foldover Plans for Two-Level Fractional Factorial Designs. 142-149 - Sanjib Basu, Nader Ebrahimi:
Bayesian Software Reliability Models Based on Martingale Processes. 150-158 - John Logsdon, Granville Tunnicliffe Wilson, Carl John Scarrott:
Prediction of Extreme Temperatures in a Reactor Using Measurements Affected by Control Action. 159-168
- Esteban Walker:
Regression Modeling Strategies. 170 - Richard F. Gunst:
Regression and ANOVA: An Integrated Approach Using SAS Software. 170-171 - Peter Wludyka:
Statistical Analysis of Designed Experiments. 171 - Subir Ghosh:
Nonparametric Analysis of Longitudinal Data in Factorial Experiments. 171-172 - Terri L. Moore:
SAS> for Linear Models. 172-173 - Jorge L. Romeu:
Practical Reliability Engineering. 173 - Thomas D. Sandry:
Longitudinal Data and SAS>: A Programmer's Guide. 173-174 - David E. Booth:
Applied Multivariate Analysis. 174 - Felix Famoye:
Plane Answers to Complex Questions: Theory of Linear Models. 174-175 - John J. Peterson:
Statistical Group Comparison. 175 - Tena I. Katsaounis:
Visualizing Statistical Models and Concepts. 175-176 - Eric R. Ziegel:
Statistical Methods for Detection and Quantification of Environmental Contamination. 176-177 - Eric V. Slud:
Graphical Models: Methods for Data Analysis and Mining. 177-178 - David J. Marchette:
Bayesian Networks and Decision Graphs. 178-179 - Alexandra Kapatou:
Testing for Normality. 179 - Robert V. Brill:
Statistics in Plain English. 179-180
- John J. Peterson:
Letter to the Editor. 185
Volume 45, Number 3, 2003
- Daniel W. Apley, Hyun Cheol Lee:
Design of Exponentially Weighted Moving Average Control Charts for Autocorrelated Processes With Model Uncertainty. 187-198 - Giovanna Capizzi, Guido Masarotto:
An Adaptive Exponentially Weighted Moving Average Control Chart. 199-207 - Harriet Black Nembhard, Ming-Shu Kao:
Adaptive Forecast-Based Monitoring for Dynamic Systems. 208-219 - Daniel W. Apley, Ho-Young Lee:
Identifying Spatial Variation Patterns in Multivariate Manufacturing Processes - A Blind Separation Approach. 220-234 - Peter Goos, Martina Vandebroek:
D-Optimal Split-Plot Designs With Given Numbers and Sizes of Whole Plots. 235-245 - Ron A. Bates, Beatrice Giglio, Henry P. Wynn:
A Global Selection Procedure for Polynomial Interpolators. 246-255 - Daniel R. Jeske, Ashwin Sampath:
Estimation of Clock Offset Using Bootstrap Bias-Correction Techniques. 256-261
- William Q. Meeker:
Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications. 262-264 - Gordon Johnston:
Statistical Models and Methods for Lifetime Data. 264-265 - Laurence L. George:
The Statistical Analysis of Failure Time Data. 265-266 - Wei Jiang:
The Mahalanobis-Taguchi Strategy. 266-267 - Eric R. Ziegel:
The Elements of Statistical Learning. 267-268 - William J. Owen:
Elements of Computational Statistics. 268-269 - Michael Frey:
Smoothing Spline ANOVA Models. 269 - Andrew M. Kuhn:
Growth Curve Models and Statistical Diagnostics. 270 - Errol C. Caby:
Elements of Applied Stochastic Processes. 270-271 - Nicole A. Lazar:
Testing Statistical Hypotheses of Equivalence. 271-272 - Tom Burr:
Causation, Prediction, and Search. 272-273 - George S. Kalemkarian:
The Six Sigma Journey From Art to Science: A Business Novel. 273 - Kenny Q. Ye:
Case Studies in Bayesian Statistics, Vol. VI. 273-274 - Thomas D. Sandry:
Introductory Statistics With R. 274-275 - Thomas H. Short:
Applied Statistics With Microsoft Excel®. 275
Volume 45, Number 4, 2003
- William I. Notz:
Editor's Report. 281-282
- William I. Notz:
Editorial Announcement. 283
- V. Roshan Joseph:
Robust Parameter Design With Feed-Forward Control. 284-292 - Irad Ben-Gal, Gail Morag, Armin Shmilovici:
Context-Based Statistical Process Control - A Monitoring Procedure for State-Dependent Processes. 293-311 - Shiyu Zhou, Yu Ding, Yong Chen, Jianjun Shi:
Diagnosability Study of Multistage Manufacturing Processes Based on Linear Mixed-Effects Models. 312-325 - Glen Hartless, James G. Booth, Ramon C. Littell:
Local Influence of Predictors in Multiple Linear Regression. 326-332 - Steven G. Gilmour, Norman R. Draper:
Confidence Regions Around the Ridge of Optimal Response on Fitted Second-Order Response Surfaces. 333-339 - Erwin Stinstra, Dick den Hertog, Peter Stehouwer, Arjen P. A. Vestjens:
Constrained Maximin Designs for Computer Experiments. 340-346 - William Li, Dennis K. J. Lin, Kenny Q. Ye:
Optimal Foldover Plans for Two-Level Nonregular Orthogonal Designs. 347-351 - Weiming Ke, Boxin Tang:
Selecting 2m-p Designs Using a Minimum Aberration Criterion When Some Two-Factor Interactions Are Important. 352-360
- Margaret A. Nemeth:
Multi- and Megavariate Data Analysis. 362 - David J. Olive:
Linear Regression Analysis. 362-363 - Diane K. Michelson:
Components of Variance. 363 - Edward C. Chao:
Generalized Estimating Equations. 363-364 - Bonnie K. Ray:
Regression Models for Time Series Analysis. 364 - Nicole A. Lazar:
Statistical Analysis With Missing Data. 364-365 - Eric R. Ziegel:
Experimental Design for Combinatorial and High Throughput Materials Development. 365 - Paul A. Tobias:
Process Improvement in the Electronics Industry. 366 - Christopher K. Wikle:
Modeling Hydrologic Change: Statistical Methods. 366-367 - Charles Annis:
Mechanical Reliability Improvement - Probability and Statistics for Experimental Testing. 367-368 - J. Wade Davis:
Statistical Pattern Recognition. 368 - Robert H. Kushler:
Statistical Computing: An Introduction to Data Analysis Using S-PLUS. 369 - Ronald H. Randles:
Applied Nonparametric Statistical Methods. 369 - J. Charles Kerkering:
Subjective and Objective Bayesian Statistics: Principles, Models, and Applications. 369-370 - Mark A. McComb:
Comparison Methods for Stochastic Models and Risks. 370-371 - W. Michael Conklin, Stan Lipovetsky:
Chaos: A Statistical Perspective. 371
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