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ORCIDTechnometrics, Volume 50
Volume 50, Number 1, 2008
- David M. Steinberg:
Technometrics at Fifty. 1 - David M. Steinberg, Søren Bisgaard:
Technometrics - How It All Started. 2-7 - Nicolas W. Hengartner
, Sarah Ellen Michalak, Bruce E. Takala, Stephen A. Wender:
Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam. 8-14 - Anna-Jane E. Vine, Susan M. Lewis, Angela M. Dean, David Brunson:
A Critical Assessment of Two-Stage Group Screening Through Industrial Experimentation. 15-25 - Nam-Ky Nguyen, Ching-Shui Cheng:
New E(S2)-Optimal Supersaturated Designs Constructed From Incomplete Block Designs. 26-31 - Maria Tripolski Kimel, Yoav Benjamini, David M. Steinberg:
The False Discovery Rate for Multiple Testing in Factorial Experiments. 32-39 - Hyun-young Choi, Hernando Ombao, Bonnie K. Ray:
Sequential Change-Point Detection Methods for Nonstationary Time Series. 40-52 - Daniel R. Jeske, Richard A. Lockhart, Michael A. Stephens, Qi Zhang:
Cramer-von Mises Tests for the Compatibility of Two Software Operating Environments. 53-63 - Yili Hong, William Q. Meeker, Luis A. Escobar:
Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities. 64-68 - K. Krishnamoorthy, Thomas Mathew, Shubhabrata Mukherjee:
Normal-Based Methods for a Gamma Distribution - Prediction and Tolerance Intervals and Stress-Strength Reliability. 69-78 - Francesc Carreras, Josep Freixas, María Albina Puente:
On the Reliability of the Self-Dual k-Out-of-n Systems. 79-85 - Mário de Castro, Manuel Galea-Rojas, Heleno Bolfarine:
Letter to the Editor. 86
- Abdulkadir Hussein:
Statistical Monitoring of Clinical Trials. 87-88 - Subir Ghosh:
Reliability and Risk: A Bayesian Perspective. 88 - Tom Burr:
Multidimensional Nonlinear Descriptive Analysis (MUNDA). 88-89 - Tena I. Katsaounis:
Introductory Statistical Inference. 89-90 - Dean V. Neubauer:
Statistical Design of Experiments With Engineering Applications. 90-91 - Weiming Ke:
Probability, Statistics, and Reliability for Engineers and Scientists. 91 - Melinda M. Holt:
Learning SAS by Example: A Programmer's Guide. 91-92 - Maliha S. Nash:
Data Preparation for Analytics Using SAS. 92 - David E. Booth:
The Cross-Entropy Method. 92 - J. Douglas Barrett:
Process Control Performance Assessment: From Theoryto Implementation. 92-93 - Donald E. Myers:
Linear and Generalized Linear Mixed Models and Their Applications. 93-94 - Xianggui Qu:
The Statistics of Gene Mapping. 94 - Hon Keung Tony Ng:
Life Cycle Reliability Engineering. 94-95 - Dean V. Neubauer:
Chemical Process Performance Evaluation. 95-96 - Michael R. Chernick:
Pharmaceutical Statistics Using SAS® A Practical Guide. 96 - S. Ejaz Ahmed:
A Handbook of Statistical Analysis Using Stata. 96-97 - S. Ejaz Ahmed:
Markov Chain Monte Carlo: Stochastic Simulation for Bayesian Inference. 97 - S. Ejaz Ahmed:
Bayesian Networks and Decision Graphs. 97 - S. Ejaz Ahmed:
Univariate and Multivariate General Linear Models - Theory and Applications With SAS. 97-98
Volume 50, Number 2, 2008
- David M. Steinberg, Søren Bisgaard, Necip Doganaksoy, Nicholas Fisher, Bert Gunter, Gerald J. Hahn, Sallie Keller-McNulty, Jon R. Kettenring, William Q. Meeker, Douglas C. Montgomery, C. F. Jeff Wu:
The Future of Industrial Statistics: A Panel Discussion. 103-127 - Jianying Zuo, William Q. Meeker, Huaiqing Wu:
Analysis of Window-Observation Recurrence Data. 128-143 - Debasis Kundu:
Bayesian Inference and Life Testing Plan for the Weibull Distribution in Presence of Progressive Censoring. 144-154 - Douglas M. Hawkins, Edgard M. Maboudou-Tchao:
Multivariate Exponentially Weighted Moving Covariance Matrix. 155-166 - Tirthankar Dasgupta, Abhyuday Mandal:
Estimation of Process Parameters to Determine the Optimum Diagnosis Interval for Control of Defective Items. 167-181 - Earl Lawrence, Derek Bingham, Chuanhai Liu, Vijayan N. Nair:
Bayesian Inference for Multivariate Ordinal Data Using Parameter Expansion. 182-191 - Peter Z. G. Qian, C. F. Jeff Wu:
Bayesian Hierarchical Modeling for Integrating Low-Accuracy and High-Accuracy Experiments. 192-204 - Max D. Morris, Leslie M. Moore, Michael D. McKay:
Using Orthogonal Arrays in the Sensitivity Analysis of Computer Models. 205-215 - Jian Zhang, Peter F. Craigmile, Noel Cressie:
Loss Function Approaches to Predict a Spatial Quantile and Its Exceedance Region. 216-227 - Georges H. Guirguis:
A Note on Computing the Probability and Critical Values for the Half-Normal Plot. 228-229
- Thomas P. Ryan:
Letter to the Editor Response to Easterling's Review of Modern Experimental Design. 231
Volume 50, Number 3, 2008
- Julia Brettschneider, François Collin, Benjamin M. Bolstad, Terence P. Speed:
Quality Assessment for Short Oligonucleotide Microarray Data. 241-264 - Wendell D. Jones:
Comment. 265-267 - Lei Bao, Ina Hoeschele:
Comment. 268-271 - Wenqing He, Shelley B. Bull:
Comment. 271-274 - Jude Kendall, B. Lakshmi:
Comment. 274-276 - Darlene R. Goldstein:
Comment. 276-279 - Julia Brettschneider, François Collin, Benjamin M. Bolstad, Terence P. Speed:
Rejoinder. 279-283 - Irene Epifanio:
Shape Descriptors for Classification of Functional Data. 284-294 - Ricardo A. Maronna, Victor J. Yohai:
Robust Low-Rank Approximation of Data Matrices With Elementwise Contamination. 295-304 - Yi Fang, Myong K. Jeong:
Robust Probabilistic Multivariate Calibration Model. 305-316 - Konstantinos Fokianos, Alexios Savvides:
On Comparing Several Spectral Densities. 317-331 - Xuemei Shan, Daniel W. Apley:
Blind Identification of Manufacturing Variation Patterns by Combining Source Separation Criteria. 332-343 - Changliang Zou, Fugee Tsung, Yukun Liu:
A Change Point Approach for Phase I Analysis in Multistage Processes. 344-356 - Giovanna Capizzi, Guido Masarotto:
Practical Design of Generalized Likelihood Ratio Control Charts for Autocorrelated Data. 357-370 - Robert W. Mee, Jihua (Regina) Xiao:
Steepest Ascent for Multiple-Response Applications. 371-382 - Peter Z. G. Qian, Huaiqing Wu, C. F. Jeff Wu:
Gaussian Process Models for Computer Experiments With Qualitative and Quantitative Factors. 383-396 - Siddhartha R. Dalal, Colin L. Mallows:
Optimal Stopping With Exact Confidence on Remaining Defects. 397-406
- Madhuri S. Mulekar:
Weight-of Evidence for Forensic DNA Profiles. 407-408 - Mark A. McComb:
The Quality Toolbox. 408 - Peihua Qiu:
Fuzzy Modeling and Fuzzy Control. 408-409 - Jeffrey E. Jarrett:
The Nature of Statistical Evidence. 409 - Harriet Black Nembhard:
Statistical Methods for Dose-Finding Experiments. 409 - Willis A. Jensen:
Decision Trees for Business Intelligence and Data Mining: Using SAS® Enterprise Miner™. 409-410 - Charles E. Heckler:
Introduction to Mixed Modelling. Beyond Regression and Analysis of Variance. 410-411 - Chris Andrews:
Competing Risks: A Practical Perspective. 411 - Snigdhansu Chatterjee:
Structural Equation Modeling, A Bayesian Approach. 411-412
Volume 50, Number 4, 2008
- David M. Steinberg:
Editor's Report. 415-417
- Leland Wilkinson:
The Future of Statistical Computing. 418-435 - John M. Chambers:
Comment. 435-437 - R. Wayne Oldford:
Comment. 437-439 - Douglas Bates:
Comment. 439-440 - Pat Hanrahan:
Comment. 440-441 - Dianne Cook, Hadley Wickham:
Comment. 442-443 - Duncan Temple Lang, Ross Ihaka:
Comment. 443-446 - Leland Wilkinson:
Rejoinder. 446-447 - Natallia Katenka, Elizaveta Levina, George Michailidis:
Robust Target Localization From Binary Decisions in Wireless Sensor Networks. 448-461 - Paul H. Kvam:
Length Bias in the Measurements of Carbon Nanotubes. 462-467 - Wessel N. van Wieringen, Jeroen de Mast:
Measurement System Analysis for Binary Data. 468-478 - Johannes Forkman:
A Method for Designing Nonlinear Univariate Calibration. 479-486 - Graciela Boente, Andrés Farall:
Robust Multivariate Tolerance Regions: Influence Function and Monte Carlo Study. 487-500 - Olivia A. Grigg, David J. Spiegelhalter:
An Empirical Approximation to the Null Unbounded Steady-State Distribution of the Cumulative Sum Statistic. 501-511 - Changliang Zou, Fugee Tsung, Zhaojun Wang:
Monitoring Profiles Based on Nonparametric Regression Methods. 512-526 - Pritam Ranjan, Derek Bingham, George Michailidis:
Sequential Experiment Design for Contour Estimation From Complex Computer Codes. 527-541
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