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ORCIDIEEE Transactions on Reliability, Volume 49
Volume 49, Number 1, March 2000
- Taghi M. Khoshgoftaar, Edward B. Allen, Wendell D. Jones
, John P. Hudepohl:
Classification-tree models of software-quality over multiple releases. 4-11 - Yves Le Traon, Thierry Jéron, Jean-Marc Jézéquel, Pierre Morel:
Efficient object-oriented integration and regression testing. 12-25 - Anneliese von Mayrhauser, Robert B. France, Michael Scheetz, Eric Dahlman:
Generating test-cases from an object-oriented model with an artifical-intelligence planning system. 26-36 - Katerina Goseva-Popstojanova, Kishor S. Trivedi:
Failure correlation in software reliability models. 37-48 - Joanne Bechta Dugan, Kevin J. Sullivan, David Coppit:
Developing a low-cost high-quality software tool for dynamic fault-tree analysis. 49-59 - Lionel C. Briand, Dietmar Pfahl:
Using simulation for assessing the real impact of test-coverage on defect-coverage. 60-70 - Gregory Levitin:
Multistate series-parallel system expansion-scheduling subject to availability constraints. 71-79 - K. W. Lee:
Stochastic models for random-request availability. 80-84 - Suprasad V. Amari:
Generic rules to evaluate system-failure frequency. 85-87 - Manouchehr M. Hosseini, Roger M. Kerr, Robert B. Randall:
An inspection model with minimal and major maintenance for a system with deterioration and Poisson failures. 88-98 - Ming Jian Zuo, Daming Lin, Yanhong Wu:
Reliability evaluation of combined k-out-of-n: F, consecutive-k-out-of-n: F and linear connected-(r, s)-out-of-(m, n): F system structures. 99-104 - Jinsheng Huang, Ming Jian Zuo, Yanhong Wu:
Generalized multi-state k-out-of-n: G systems. 105-111
Volume 49, Number 2, June 2000
- Ralph A. Evans:
Models for reliability of repaired equipment [Editorial]. 125 - Ralph A. Evans:
The unreliability of real-life software [Editorial]. 126 - James R. Wilson, R. Christopher Hunt:
Problems with correlated data. 127-130 - D. J. Sherwin:
Steady-state desires availability. 131-132 - Ray Sperber:
The problem of reliability as a discipline. 133 - Harold E. Ascher, Christian K. Hansen:
Comment on: stupid statistics [Editorial]. 134-135 - Alec Feinberg, Allan Widom:
On thermodynamic reliability engineering. 136-146 - R. V. V. V. J. Rao, T. C. Chong, L. S. Tan, W. S. Lau:
Thermal stability of MISFET with low-temp molecular-beam epitaxy-grown GaAs and Al0.3Ga0.7As gate ins. 147-152 - Tae-Jin Lim, Chang-Hoon Lie:
Analysis of system reliability with dependent repair modes. 153-162 - Kyriakos I. Petakos:
Failure coefficients and a characterization function for them. 163-164 - Peter Kubat, J. MacGregor Smith, Calvin Yum:
Design of cellular networks with diversity and capacity constraints. 165-175 - Way Kuo, V. Rajendra Prasad:
An annotated overview of system-reliability optimization. 176-187 - Noé Lopez-Benitez:
Petri-net based performance-evaluation of distributed homogeneous task systems. 188-198 - Uditha Balasooriya, N. Balakrishnan:
Reliability sampling plans for lognormal distribution, based on progressively-censored samples. 199-203 - Michael J. Phillips:
Bootstrap confidence regions for the expected ROCOF of a repairable system. 204-208 - Taghi M. Khoshgoftaar, Edward B. Allen:
A practical classification-rule for software-quality models. 209-216 - Wendai Wang, Dimitri B. Kececioglu:
Fitting the Weibull log-linear model to accelerated life-test data. 217-223 - W. Jason Owen, William J. Padgett:
A Birnbaum-Saunders accelerated life model. 224-229 - John D. Andrews, Sarah J. Dunnett:
Event-tree analysis using binary decision diagrams. 230-238
Volume 49, Number 3, September 2000
- Laurence E. LaForge:
What designers of microelectronic systems should know about arrays spared by rows and columns. 251-272 - Philip P. Shirvani, Nirmal R. Saxena, Edward J. McCluskey:
Software-implemented EDAC protection against SEUs. 273-284 - Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey:
Common-mode failures in redundant VLSI systems: a survey. 285-295 - John C. Lach, William H. Mangione-Smith, Miodrag Potkonjak:
Enhanced FPGA reliability through efficient run-time fault reconfiguration. 296-304 - Didier Keymeulen, Ricardo Salem Zebulum, Yili Jin, Adrian Stoica:
Fault-tolerant evolvable hardware using field-programmable transistor arrays. 305-316 - Alan O. Plait:
Commentary: interconnection of massive numbers of paths. 317-318 - John D. Healy:
Commentary-software: metrics mentality versus statistical mentality. 319-321 - Lorenzo Traldi:
Commentary on: reliability polynomials and link importance in networks. 322 - V. Rajendra Prasad, Way Kuo:
Reliability optimization of coherent systems. 323-330
Volume 49, Number 4, December 2000
- Ralph A. Evans:
Editorial Say What You Mean. 333 - Ralph A. Evans:
Editorial In Statistical Control - What Does it Mean? 334 - Patrick D. T. O'Connor:
Commentary: reliability-past, present, and future. 335-341 - Yu Hayakawa, Paul Siu Fai Yip:
A Gibbs-sampler approach to estimate the number of faults in a system using capture-recapture sampling [software reliability]. 342-350 - Masao Futatsuya:
Prediction intervals for system lifetime, based on component test data. 351-354 - Seong Woo Kwak, Byung Kook Kim:
Task-scheduling strategies for reliable TMR controllers using task grouping and assignment. 355-362 - Karama Kanoun, Marie Ortalo-Borrel:
Fault-tolerant system dependability-explicit modeling of hardware and software component-interactions. 363-376 - Yoonjung Yang, Georgia-Ann Klutke:
Lifetime-characteristics and inspection-schemes for Levy degradation processes. 377-382
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